Dokumentation 2008 - Max-Planck-Institut für Intelligente Systeme

Dokumentation 2008
Veröffentlichungen
Kaiser, T., W. Sigle, D. Goll, N. H. Goo, V. Srot, P. A. van Aken, E. Detemple and W. Jäger:
Transmission electron microscopy study of the intermixing of Fe-Pt multilayers. Journal of
Applied Physics 103, 063913 (2008)
Kasper, N. V., P. Wochner, A. Vigliante, H. Dosch, G. Jakob, H. D. Carstanjen and R. K. Kremer:
Epitaxial growth and properties of (001)-oriented TbBaCo 2
O 6-α
films. Journal of Applied Physics
103, 013907 (2008)
Kilian, H. G., D. Bartkowiak, D. Kaufmann and R. Kemkemer: The general growth logistics of
cell populations. Cell Biochemistry and Biophysics 51, 2-3, 51-66 (2008)
Koch, C. T.: A flux-preserving non-linear inline holography reconstruction algorithm for
partially coherent electrons. Ultramicroscopy 108, 141-150 (2008)
Koch, C. T., P. Bellina and P. A. van Aken: Software precession electron diffraction. In:
EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, (Eds.)
M. Luysberg, K. Tillmann, T. Weirich. Springer, Berlin [et al.] 2008, 201-202
Koch, C. T., B. Rahmati and P. A. van Aken: Nonlinear electron inline holography. In:
EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, (Eds.)
M. Luysberg, K. Tillmann, T. Weirich. Springer, Berlin [et al.] 2008, 261-264
Koch, C. T., W. Sigle, J. Nelayah, L. Gu, V. Srot and P. A. van Aken: Sub-0.5 eV EFTEM
mapping using the Zeiss SESAM. In: EMC2008, 14th European Microscopy Congress, Vol. 1:
Instrumentation and Methods, (Eds.) M. Luysberg, K. Tillmann, T. Weirich. Springer, Berlin [et
al.] 2008, 447-448
Koch, K., A. J. Schulte, A. Fischer, S. N. Gorb and W. Barthlott: A fast, precise and low-cost
replication technique for nano- and high-aspect-ratio structures of biological and artificial
surfaces. Bioinspiration & Biomimetics 3, 046002 (2008)
König, P.-M., R. Roth and S. Dietrich: Lock and key model system. Europhysics Letters 84, 06,
68006 (2008)
Konyashin, I., B. Ries, F. Lachmann, R. Cooper, A. Mazilkin, B. Straumal, A. Aretz and V.
Babaev: Hardmetals with nanograin reinforced binder: binder fine structure and hardness.
International Journal of Refractory Metals & Hard Materials 26, 583-588 (2008)
Krauss, T. N., E. Barrena, X. N. Zhang, D. G. de Oteyza, J. Major, V. Dehm, F. Würthner,
L. P. Cavalcanti and H. Dosch: Three-dimensional molecular packing of thin organic films of
PTCDI-C 8
determined by surface X-ray diffraction. Langmuir 24, 12742-12744 (2008)
Kronmüller, H. and D. Goll: Pinning of domain walls in composite particles. Physica B 403,
237-241 (2008)
Kukuruznyak, D., H. Reichert, K. Ohmori, P. Ahmet and T. Chikyow: Pliant epitaxial ionic
oxides on silicon. Advanced Material 20, 20, 3827-3831 (2008)
Kurta, R. P., V. N. Bugaev, A. Stierle and H. Dosch: Incommensurate strain-induced ordering of
interstitial oxygen in Nb. Journal of Physics: Condensed Matter 20, 27, 275206 (2008)
Kuru, Y., O. Savasir, S. Z. Nergiz, C. Oncel, M. A. Gülgün, S. Haug and P. A. van Aken: Yttrium
aluminum garnet as a scavenger for Ca and Si. Journal of the American Ceramic Society 91,
3663-3667 (2008)
Kuru, Y., M. Wohlschlögel, U. Welzel and E. J. Mittemeijer: Coefficients of thermal expansion
of thin metal films investigated by non-ambient x-ray diffraction stress analysis. Surface &
Coatings Technology 202, 2306-2309 (2008)
Kuru, Y., M. Wohlschlögel, U. Welzel and E. J. Mittemeijer: Non-ambient X-ray diffraction
residual stress analysis of thin films: tracing nanosize-related effects on thermoelastic constants
and identifying sources of residual stresses. Journal of Applied Crystallography 41, 425-428
(2008)
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