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Contacting various metal compositions using ViProbe® Vertical ...

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Motivation<br />

• Minimum pad deformation post sort required<br />

for,<br />

– Die shipping direct to customer (automotive).<br />

– FCOL (Flip Chip on Lead) Bumping process.<br />

– OPM (Over Pad Metallisation) Assembly process.<br />

• Multiple ‘contact pad’ <strong>metal</strong> <strong>compositions</strong>,<br />

– Al, Au, Cu.<br />

• Multi‐site Sort >8 sites / Grid Array Pattern.<br />

– EWLP (Embedded Wafer Level Package).<br />

• WLCSP (Minus bump).<br />

June 6 to 9, 2010 IEEE SW Test Workshop 4

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