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3b) In the 2nd last sentence the phrase 'at different time points after implantation' suggests a<br />

longitudinal study tracking changes in N1 latency and amplitude over time. My understanding<br />

is that this is not the case. You are simply referring to the test-retest reliability. Please clarify<br />

this statement as at first glance it is rather confusing.<br />

Reply: The two experiments were not designed to be part of a longitudinal study, since it was<br />

not possible to re-test all CI users, and the task and type of stimuli changed. However the two<br />

experiments in fact provide AEPs from a sub-group of CI users that were tested in our<br />

laboratory at two different time points after implantation.<br />

4) Line 47-48. Surprisingly, <strong>for</strong> a study on CI EEG Koelsch et al 2004 make no mention what<br />

so ever of CI artifacts. They do not say 'electrical artifacts only [occur] at response latencies<br />

different from cortical AEPs', as the authors suggest. Also, the verb 'occurs' appears to be<br />

missing from the sentence.<br />

Reply: Revised.<br />

5) Line 59-60. As the authors correctly point out subtraction techniques severely limit the kind<br />

of stimuli that can be applied but to say that they have only been tested on a small population<br />

is wrong. Different variations of the subtraction technique are the most commonly used<br />

artifact cancelation technique (eg ECAP <strong>for</strong>ward masking paradigm, Brown et al 1990).<br />

Reply: When we mentioned that the subtraction technique has only been tested <strong>for</strong> a small<br />

population, we meant in the context of multi-channel EEG recordings, as reported by Friesen<br />

and Picton, 2010. We have amended the text in the manuscript to avoid confusion.<br />

6) Line 96-97. Are you saying that you only adjusted the CIAC parameters on study 1 and<br />

then used these settings <strong>for</strong> study 2? Please clarify.<br />

Reply: We apologize <strong>for</strong> the confusion. The parameters were adjusted <strong>for</strong> each study and it<br />

was not our goal to define a set of default parameters. We have provided some guidelines in<br />

the manuscript about reasonable ranges <strong>for</strong> the different thresholds based in our own<br />

experience. However we believe that the user should have the flexibility to control and adjust<br />

the parameters when necessary. We have revised the text in order to describe CIAC not as an<br />

“automatic” procedure but as a more objective procedure to identify ICs representing the CI<br />

artifact.<br />

7) Lines 114-115. ERP is not defined. Also, at other places in the text ERP seems to be used to<br />

refer to a specific independent component after ICA analysis, while its normal usage is to<br />

refer to an event related potential be<strong>for</strong>e ICA takes place. Please give a clear definition and<br />

tighten up the language and usage.<br />

Reply: We agree that it is important to make a distinction between event related potential<br />

(ERP) and the time-locked average of the activation of a certain IC (IC ERP). The text has<br />

been amended.<br />

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