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Diploma Thesis - Erich Schmid Institute

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X-ray Diffraction – Measurements and Alignment<br />

In the present case, the high resolution monochromator was manufactured out of a<br />

piece of germanium single crystal, where the two channel cut crystals are joined by a<br />

spring. This significantly simplifies the usually complicated alignment procedure.<br />

The cut through the two blocks was done by taking into account two different<br />

scattering planes. In the first block (1 1 1) and ( 1 1 1 ) and in the second block<br />

( 2 2 0) and (2 2 0) planes are involved. The basic idea is that two couples of<br />

reflection with non parallel scattering vectors are being obtained in the same crystal<br />

for some specific geometry and by inducing a small bending δ of the crystal, as can<br />

be seen in figure 9.4. The monolithic design makes it not necessary to tilt the<br />

alignment like it is done with Bartels monochromator, since the crystal cut is designed<br />

to guarantee that the scattering plane in the first and the second block coincide within<br />

a good accuracy.<br />

Figure 9.4: Monolithic monochromator under small bending<br />

The final wavelength, dispersion and divergence are of interest for the measurement.<br />

A way to qualitatively evaluate these parameters can be found by using DuMond<br />

diagrams for multiple diffractions. According to the dynamical theory of X-ray<br />

diffraction, the reflectivity of a perfect crystal for a fixed wavelength is close to 100%<br />

in a finite ∆α range of several seconds of arc. Thus the DuMond diagram of a perfect<br />

crystal is a band of width ∆α in the λ−α space. In the DuMond diagram, shown in<br />

figure 9.5, two bands of wavelengths for several diffractions are plotted, one for the<br />

first block with asymmetric (1 1 1) reflection and one for the second block with<br />

symmetric (2 2 0) reflection. The cross section of the DuMond diagram for two<br />

crystals gives the wavelength dispersion and the divergence of the final X-ray beam.<br />

For the high resolution monochromator a wavelength dispersion ∆λ / λ = 2·10 -4 and a<br />

divergence of ∆α = 15,4 arcsec is obtained, by using CuKα X-ray radiation.<br />

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