Robust System Design - VLSI
Robust System Design - VLSI
Robust System Design - VLSI
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Single Event Multiple Upsets (SEMU)<br />
SEMUs (aka MBUs) increasing<br />
Single error assumption not sufficient<br />
Measured<br />
Error rate<br />
(arbitrary<br />
units)<br />
10 4<br />
10 3<br />
10 2<br />
10<br />
1<br />
“Basic”<br />
flip-flop<br />
2X<br />
flip-flop<br />
Radiation<br />
experiment results<br />
BISER<br />
flip-flop<br />
New<br />
LEAP<br />
flip-flop<br />
[IRPS 10]<br />
27