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Fan-in WLCSP matures, what's next? IMT on the role ... - I-Micronews

Fan-in WLCSP matures, what's next? IMT on the role ... - I-Micronews

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F E B R U A R Y 2 0 1 0 i s s u e n ° 1 4<br />

N e w s l e t t e r o n 3 D I C , T S V , W L P & E m b e d d e d T e c h n o l o g i e s<br />

C O M P A N Y V I S I O N<br />

<str<strong>on</strong>g>IMT</str<strong>on</strong>g> <strong>on</strong> <strong>the</strong> <strong>role</strong> of Wafer-Level Packag<str<strong>on</strong>g>in</str<strong>on</strong>g>g <str<strong>on</strong>g>in</str<strong>on</strong>g> MEMS<br />

From page 1<br />

In <strong>the</strong> future, WLP will play a greater <strong>role</strong> <str<strong>on</strong>g>in</str<strong>on</strong>g> <strong>the</strong><br />

<str<strong>on</strong>g>in</str<strong>on</strong>g>tegrati<strong>on</strong> of heterogeneous technologies. Right<br />

now, we’re see<str<strong>on</strong>g>in</str<strong>on</strong>g>g die-level MEMS and CMOS<br />

devices wire b<strong>on</strong>ded and encapsulated. We also see<br />

build<str<strong>on</strong>g>in</str<strong>on</strong>g>g MEMS directly <strong>on</strong> CMOS wafers. Not too<br />

far off, we expect to see completed MEMS wafers<br />

or wafer stacks b<strong>on</strong>ded to completed CMOS wafers.<br />

IR emitter/gas sensor is hermetically packaged at wafer<br />

level with sub-mTorr vacuum. As a technology platform<br />

<str<strong>on</strong>g>IMT</str<strong>on</strong>g> <str<strong>on</strong>g>in</str<strong>on</strong>g>tegrates wafer-level packag<str<strong>on</strong>g>in</str<strong>on</strong>g>g to improve<br />

performance and reliability, and reduce backend cost.<br />

Image courtesy of ICx Precisi<strong>on</strong> Phot<strong>on</strong>ics.<br />

YD: What key materials, equipment, and<br />

technologies still need to developed for MEMS<br />

wafer-level packag<str<strong>on</strong>g>in</str<strong>on</strong>g>g?<br />

CT: There isn’t a simple answer to this questi<strong>on</strong>.<br />

<str<strong>on</strong>g>IMT</str<strong>on</strong>g> has been <str<strong>on</strong>g>in</str<strong>on</strong>g>corporat<str<strong>on</strong>g>in</str<strong>on</strong>g>g WLP technology<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g>to our customers’ products for a l<strong>on</strong>g time. Our<br />

standard soluti<strong>on</strong> already fulfills and exceeds <strong>the</strong><br />

requirements of <strong>the</strong> applicati<strong>on</strong>s it serves. We<br />

believe all of <strong>the</strong> build<str<strong>on</strong>g>in</str<strong>on</strong>g>g blocks are already out<br />

<strong>the</strong>re. There are, however, specific applicati<strong>on</strong>s that<br />

require additi<strong>on</strong>al R&D to better understand how<br />

those blocks fit toge<strong>the</strong>r. For those applicati<strong>on</strong>s,<br />

WLP has to be customized to meet a number of<br />

variables, such as vacuum level, <strong>the</strong>rmal budget,<br />

and cost.<br />

YD: What is <str<strong>on</strong>g>IMT</str<strong>on</strong>g>’s approach to MEMS waferlevel<br />

packag<str<strong>on</strong>g>in</str<strong>on</strong>g>g?<br />

CT: <str<strong>on</strong>g>IMT</str<strong>on</strong>g> began WLP development <str<strong>on</strong>g>in</str<strong>on</strong>g> 2002, and<br />

manufactured its first product us<str<strong>on</strong>g>in</str<strong>on</strong>g>g WLP <str<strong>on</strong>g>in</str<strong>on</strong>g> 2003.<br />

We traveled some roads that led to dead ends,<br />

but my po<str<strong>on</strong>g>in</str<strong>on</strong>g>t is that WLP is not new to <str<strong>on</strong>g>IMT</str<strong>on</strong>g>. We’ve<br />

learned what works and, just as important, what<br />

doesn’t. Through <strong>the</strong> years, we’ve developed proven<br />

approaches and technologies used specifically for<br />

WLP applicati<strong>on</strong>s.<br />

<str<strong>on</strong>g>IMT</str<strong>on</strong>g> now makes hermetic WLP us<str<strong>on</strong>g>in</str<strong>on</strong>g>g glass frit,<br />

eutectic, anodic, Au-Au <strong>the</strong>rmocompressi<strong>on</strong>, and<br />

silic<strong>on</strong> fusi<strong>on</strong> b<strong>on</strong>d<str<strong>on</strong>g>in</str<strong>on</strong>g>g. We tailor <strong>the</strong> use of <strong>the</strong>se<br />

depend<str<strong>on</strong>g>in</str<strong>on</strong>g>g up<strong>on</strong> <strong>the</strong> applicati<strong>on</strong>.<br />

As device and wafer <str<strong>on</strong>g>in</str<strong>on</strong>g>tegrati<strong>on</strong> <str<strong>on</strong>g>in</str<strong>on</strong>g>creases, we’re<br />

keen to recognize temperature sensitivity to<br />

mechanical structures or material stresses that can<br />

occur from <strong>the</strong> results of additi<strong>on</strong>al high-temperature<br />

b<strong>on</strong>d<str<strong>on</strong>g>in</str<strong>on</strong>g>g. For this reas<strong>on</strong>, <str<strong>on</strong>g>IMT</str<strong>on</strong>g> developed a<br />

proprietary metal alloy b<strong>on</strong>d that can be used to<br />

create a hermetic seal at a temperature less than<br />

200°C. The b<strong>on</strong>d l<str<strong>on</strong>g>in</str<strong>on</strong>g>e width is reduced compared to<br />

o<strong>the</strong>r techniques, provid<str<strong>on</strong>g>in</str<strong>on</strong>g>g more usable space for<br />

<strong>the</strong> MEMS. This can be as big a benefit as <strong>the</strong> lowtemperature<br />

feature of <strong>the</strong> b<strong>on</strong>d. This b<strong>on</strong>d is well<br />

proven and has been used <str<strong>on</strong>g>in</str<strong>on</strong>g> many programs with<br />

product yields exceed<str<strong>on</strong>g>in</str<strong>on</strong>g>g 99%.<br />

Al<strong>on</strong>g with our diverse list of b<strong>on</strong>d<str<strong>on</strong>g>in</str<strong>on</strong>g>g opti<strong>on</strong>s, we<br />

believe that our low-temperature b<strong>on</strong>d sets us apart<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g> <strong>the</strong> market today.<br />

YD: How is <str<strong>on</strong>g>IMT</str<strong>on</strong>g> ‘WLP-specific’ compared to<br />

o<strong>the</strong>r MEMS foundries?<br />

CT: Like any pure-play foundry, <str<strong>on</strong>g>IMT</str<strong>on</strong>g> is very<br />

fortunate to get great perspective <strong>on</strong> <strong>the</strong> market<br />

because we’re like <strong>the</strong> ‘Switzerland’ of <strong>the</strong> MEMS<br />

space—we’re exposed to and service multitudes<br />

of customers across many diverse markets. In <strong>the</strong><br />

past, technology requirements for creat<str<strong>on</strong>g>in</str<strong>on</strong>g>g products<br />

were as separate as <strong>the</strong> markets <strong>the</strong>mselves.<br />

This isn’t <strong>the</strong> case anymore. We now see that<br />

technology requirements are c<strong>on</strong>verg<str<strong>on</strong>g>in</str<strong>on</strong>g>g and <str<strong>on</strong>g>IMT</str<strong>on</strong>g><br />

f<str<strong>on</strong>g>in</str<strong>on</strong>g>ds it comm<strong>on</strong>place to <str<strong>on</strong>g>in</str<strong>on</strong>g>tegrate what were <strong>on</strong>ce<br />

disparate process technologies and modules <str<strong>on</strong>g>in</str<strong>on</strong>g>to<br />

s<str<strong>on</strong>g>in</str<strong>on</strong>g>gle devices at wafer level.<br />

<str<strong>on</strong>g>IMT</str<strong>on</strong>g> has developed some of <strong>the</strong> most advanced<br />

processes that have resulted <str<strong>on</strong>g>in</str<strong>on</strong>g> manufactur<str<strong>on</strong>g>in</str<strong>on</strong>g>g<br />

some of <strong>the</strong> most lead<str<strong>on</strong>g>in</str<strong>on</strong>g>g-edge MEMS devices<br />

<strong>on</strong> <strong>the</strong> market today. We’ve taken <strong>the</strong> <str<strong>on</strong>g>next</str<strong>on</strong>g> step to<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g>tegrate <strong>the</strong>se processes and materials <str<strong>on</strong>g>in</str<strong>on</strong>g>to s<str<strong>on</strong>g>in</str<strong>on</strong>g>gle,<br />

unique devices. Today, <str<strong>on</strong>g>IMT</str<strong>on</strong>g> is manufactur<str<strong>on</strong>g>in</str<strong>on</strong>g>g a<br />

device that <str<strong>on</strong>g>in</str<strong>on</strong>g>tegrates reflexive and refractive optics,<br />

3D microfluidics, and high-speed electromagnetic<br />

actuati<strong>on</strong> us<str<strong>on</strong>g>in</str<strong>on</strong>g>g numerous materials <str<strong>on</strong>g>in</str<strong>on</strong>g> a fourwafer<br />

stack, mak<str<strong>on</strong>g>in</str<strong>on</strong>g>g what we believe is <strong>the</strong> most<br />

sophisticated device ever built us<str<strong>on</strong>g>in</str<strong>on</strong>g>g WLP. We like<br />

to th<str<strong>on</strong>g>in</str<strong>on</strong>g>k that <str<strong>on</strong>g>IMT</str<strong>on</strong>g> separates itself by blaz<str<strong>on</strong>g>in</str<strong>on</strong>g>g <strong>the</strong> trail<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g> complex <str<strong>on</strong>g>in</str<strong>on</strong>g>tegrati<strong>on</strong> of process and technologies<br />

through WLP.<br />

YD: What’s <str<strong>on</strong>g>IMT</str<strong>on</strong>g>’s stance <strong>on</strong> us<str<strong>on</strong>g>in</str<strong>on</strong>g>g 3D TSV <str<strong>on</strong>g>in</str<strong>on</strong>g> MEMS?<br />

CT: Of course we’re ‘bullish.’ We’re already build<str<strong>on</strong>g>in</str<strong>on</strong>g>g<br />

products with nearly 140,000 hermetic copper<br />

TSVs per wafer. There’s no argument that fur<strong>the</strong>r<br />

m<str<strong>on</strong>g>in</str<strong>on</strong>g>iaturizati<strong>on</strong> of products will require TSVs.<br />

C<strong>on</strong>venient c<strong>on</strong>sequences of us<str<strong>on</strong>g>in</str<strong>on</strong>g>g TSVs are that<br />

<strong>the</strong>y reduce rout<str<strong>on</strong>g>in</str<strong>on</strong>g>g complexity and device footpr<str<strong>on</strong>g>in</str<strong>on</strong>g>t,<br />

which can ultimately lead to lower-cost products.<br />

Copper TSVs can dramatically improve electrical<br />

performance-specifically required <str<strong>on</strong>g>in</str<strong>on</strong>g> <strong>the</strong> RF world. As<br />

an example, <str<strong>on</strong>g>IMT</str<strong>on</strong>g>’s copper TSVs offer a DC resistance<br />

of less than 0.1 Ohms per via, with an <str<strong>on</strong>g>in</str<strong>on</strong>g>serti<strong>on</strong> loss of<br />

-0.1dB at 6GHz.<br />

Fill<str<strong>on</strong>g>in</str<strong>on</strong>g>g metal TSVs with higher aspect ratios and<br />

achiev<str<strong>on</strong>g>in</str<strong>on</strong>g>g good yields has been a challenge for our<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g>dustry. <str<strong>on</strong>g>IMT</str<strong>on</strong>g> has solved <strong>the</strong> problem and shipped<br />

hundreds of wafers with a fully characterized 15µm x<br />

60µm hermetic copper TSVs. We plan to announce a<br />

larger TSV so<strong>on</strong>, which we’re currently characteriz<str<strong>on</strong>g>in</str<strong>on</strong>g>g.<br />

YD: Where do you see wafer-level packag<str<strong>on</strong>g>in</str<strong>on</strong>g>g for<br />

IR sensors head<str<strong>on</strong>g>in</str<strong>on</strong>g>g?<br />

CT: IR sensors are used across commercial<br />

applicati<strong>on</strong>s for gases <str<strong>on</strong>g>in</str<strong>on</strong>g> biomedical and <str<strong>on</strong>g>in</str<strong>on</strong>g>dustrial<br />

safety, but are also used by <strong>the</strong> military. It’s an<br />

applicati<strong>on</strong> <str<strong>on</strong>g>in</str<strong>on</strong>g> which size and weight of <strong>the</strong> emitter<br />

or sensor are critical. S<str<strong>on</strong>g>in</str<strong>on</strong>g>ce grams and millimeters<br />

count, we feel that WLP represents a great<br />

opportunity for product enhancement. But <strong>the</strong>re are<br />

two c<strong>on</strong>siderati<strong>on</strong>s: The product must be packaged<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g> high vacuum to m<str<strong>on</strong>g>in</str<strong>on</strong>g>imize heat loss; and due to<br />

<strong>the</strong> characteristics of VOx, which is <strong>the</strong> prevalent<br />

material for microbolometers, <strong>the</strong> b<strong>on</strong>d must be<br />

made at low temperature. While ei<strong>the</strong>r requirement<br />

<strong>on</strong> its own isn’t an issue, comb<str<strong>on</strong>g>in</str<strong>on</strong>g><str<strong>on</strong>g>in</str<strong>on</strong>g>g <strong>the</strong> two for WLP<br />

creates a challenge.<br />

This is where <str<strong>on</strong>g>IMT</str<strong>on</strong>g> can help. We’ve been mass<br />

produc<str<strong>on</strong>g>in</str<strong>on</strong>g>g an IR emitter and gas sensor for<br />

several years, which is a three-wafer-b<strong>on</strong>ded<br />

stack packaged <str<strong>on</strong>g>in</str<strong>on</strong>g> a vacuum of less than 1mTorr.<br />

Leverag<str<strong>on</strong>g>in</str<strong>on</strong>g>g this process and comb<str<strong>on</strong>g>in</str<strong>on</strong>g><str<strong>on</strong>g>in</str<strong>on</strong>g>g it with<br />

our low-temperature hermetic alloy b<strong>on</strong>d, <str<strong>on</strong>g>IMT</str<strong>on</strong>g> is<br />

positi<strong>on</strong>ed to help move microbolometer-based<br />

IR sensors <str<strong>on</strong>g>in</str<strong>on</strong>g>to WLP, reduc<str<strong>on</strong>g>in</str<strong>on</strong>g>g weight, size, and<br />

ultimately, cost. This is simply an evoluti<strong>on</strong> of<br />

<str<strong>on</strong>g>in</str<strong>on</strong>g>ternal development that we will be talk<str<strong>on</strong>g>in</str<strong>on</strong>g>g about<br />

so<strong>on</strong>. Stay tuned!<br />

X-ray tomography of a copper TSV wafer, show<str<strong>on</strong>g>in</str<strong>on</strong>g>g<br />

plated metal vias without voids.<br />

Craig Trautman, Vice President of Bus<str<strong>on</strong>g>in</str<strong>on</strong>g>ess<br />

Development at Innovative Micro Technology<br />

www.imtmems.com<br />

Craig Trautman, Vice President<br />

of Bus<str<strong>on</strong>g>in</str<strong>on</strong>g>ess Development at<br />

Innovative Micro Technology<br />

Trautman has more than 25<br />

years’ experience work<str<strong>on</strong>g>in</str<strong>on</strong>g>g <str<strong>on</strong>g>in</str<strong>on</strong>g><br />

eng<str<strong>on</strong>g>in</str<strong>on</strong>g>eer<str<strong>on</strong>g>in</str<strong>on</strong>g>g, market<str<strong>on</strong>g>in</str<strong>on</strong>g>g, and<br />

bus<str<strong>on</strong>g>in</str<strong>on</strong>g>ess development <str<strong>on</strong>g>in</str<strong>on</strong>g> <strong>the</strong> semic<strong>on</strong>ductor<br />

and MEMS <str<strong>on</strong>g>in</str<strong>on</strong>g>dustries. He holds B.S. degrees <str<strong>on</strong>g>in</str<strong>on</strong>g><br />

Electrical Eng<str<strong>on</strong>g>in</str<strong>on</strong>g>eer<str<strong>on</strong>g>in</str<strong>on</strong>g>g and Computer Eng<str<strong>on</strong>g>in</str<strong>on</strong>g>eer<str<strong>on</strong>g>in</str<strong>on</strong>g>g<br />

from <strong>the</strong> University of Missouri.<br />

6

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