DEPFET Pixel Vertex Detector for the ILC - MPG HLL
DEPFET Pixel Vertex Detector for the ILC - MPG HLL
DEPFET Pixel Vertex Detector for the ILC - MPG HLL
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Abstract<br />
<strong>DEPFET</strong> pixels offer <strong>the</strong> unique possibility <strong>for</strong> a high resolution pixel vertex<br />
detector as <strong>the</strong> innermost component of <strong>the</strong> tracking system in an <strong>ILC</strong><br />
detector. The key idea of <strong>DEPFET</strong> sensors is <strong>the</strong> integration of amplifying<br />
transistors into a fully depleted bulk in such a way that all signal charges are<br />
collected in <strong>the</strong> ’internal gates’ of <strong>the</strong> transistors. The excellent noise per<strong>for</strong>mance<br />
obtained through <strong>the</strong> low input capacitance in combination with <strong>the</strong><br />
full primary signal leads to a large S/N ratio. The sensor itself can <strong>the</strong>re<strong>for</strong>e<br />
be made very thin (50µm) without loss of efficiency. Readout is per<strong>for</strong>med<br />
by cyclic enabling of transistor rows in a large matrix. The total system,<br />
including readout and sequencing chips, is expected to dissipate about 4 W<br />
<strong>for</strong> a 5 layer geometry assuming a 1:200 power duty cycle.<br />
In this status report <strong>the</strong> progress of <strong>the</strong> <strong>DEPFET</strong> development towards an<br />
<strong>ILC</strong> vertex detector with respect to <strong>the</strong> PRC review in may 2003 is presented.<br />
The most important achievements are <strong>the</strong> realization of several prototype<br />
sensor matrices using double metal technology, <strong>the</strong> design, fabrication and<br />
characterization of fast steering and readout chips, <strong>the</strong> realization of an <strong>ILC</strong><br />
suited prototype system, <strong>the</strong> preliminary measurement of its per<strong>for</strong>mance in<br />
<strong>the</strong> lab as well as in <strong>the</strong> test beam, progress in and validation of <strong>the</strong> thinning<br />
technology and studies on <strong>the</strong> radiation tolerance of <strong>DEPFET</strong> sensors. In<br />
particular, <strong>DEPFET</strong> pixel sensors have proven to be radiation tolerant in<br />
excess of 1 Mrad ionizing dose.<br />
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