ekS - Instytut Agrofizyki im. Bohdana DobrzaÅskiego PAN w Lublinie ...
ekS - Instytut Agrofizyki im. Bohdana DobrzaÅskiego PAN w Lublinie ...
ekS - Instytut Agrofizyki im. Bohdana DobrzaÅskiego PAN w Lublinie ...
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
increase of temperature increases their kinetic energy that raises the relaxation<br />
frequency and they become more mobile in the <strong>im</strong>posed EM field. The bound<br />
water molecules released from the solid surface become now free water molecules<br />
with higher value of the real part of the complex dielectric permittivity.<br />
It can be added here that the release of water from the solids results in the<br />
increase of ε' and decrease of ε" in (37) describing the loss tangent of dielectric<br />
material. This phenomenon leads to a new equilibrium with more free water in<br />
expense to bound water.<br />
Following Boyarskii et al. [12], Or and Wraith [72] and Wraith and Or [105],<br />
only a few layers of water covering soil particle are subjected to the change of<br />
relaxation t<strong>im</strong>e in relation to relaxation t<strong>im</strong>e of free water. Boyarskii et al. [12]<br />
report the analysis of nuclear resonance spectra of bound water films in clay<br />
showing the approx<strong>im</strong>ated relation between relaxation t<strong>im</strong>e of bound water, and<br />
thickness of the film covering soil particles. The relaxation t<strong>im</strong>e of bound water<br />
drops rapidly with the number of layers covering soil particle and it seems that<br />
only one or two layers have significantly longer relaxation t<strong>im</strong>es than that of free<br />
water.<br />
The average rise t<strong>im</strong>e, t r , of TDR pulses is about 0.3⋅10 -9 s (He<strong>im</strong>ovaara [39],<br />
Malicki and Skierucha [59]). This t<strong>im</strong>e relates to the frequency bandwidth, bw, of<br />
TDR soil water content meters with the following formula given in Strickland<br />
[87]:<br />
0.35<br />
bw = ≈ 1.2 [GHz]<br />
(53)<br />
[ns]<br />
t r<br />
The authors of [72,105] recognized this frequency l<strong>im</strong>it as the cut-off<br />
frequency, f * , that distinguishes water molecules between free and bound. Water<br />
layers having dielectric relaxation frequencies lower than the cut-off frequency<br />
were considered as bound water having lower dielectric permittivity than for free<br />
water.<br />
Rearrangement of (52) for a given TDR cut-off frequency, f * , and<br />
temperature, T, leads to the s<strong>im</strong>plified relation for the calculation of the thickness,<br />
x(T ), of bound water layer:<br />
x<br />
( T )<br />
a<br />
=<br />
⎛ kT<br />
− d + T ln⎜<br />
2 3<br />
⎝ 8π<br />
r cf<br />
∗<br />
⎞<br />
⎟<br />
⎠<br />
(54)<br />
64