Book of abstracts - Euro-MBE 2011 - CNRS
Book of abstracts - Euro-MBE 2011 - CNRS
Book of abstracts - Euro-MBE 2011 - CNRS
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POSTER SESSION 1<br />
Monday, March 21 st 19:00 – 20:45<br />
OPENING SESSION<br />
MoP10<br />
MoP11<br />
MoP12<br />
MoP13<br />
MoP14<br />
Near infrared high efficiency InAs/GaAsSb QDLEDs: band<br />
alignment and carrier recombination mechanisms.<br />
A. Hierro, M. Montes, M. Moral, J.M. Ulloa, A. Guzman.<br />
In-situ Reflectance Anisotropy Spectroscopy (RAS) for<br />
doping control during <strong>MBE</strong> growth <strong>of</strong> AlGaInAsSb laser<br />
structures .<br />
D. H<strong>of</strong>fmann , T. Loeber and H. Fouckhardt.<br />
Effect <strong>of</strong> growth temperature on surface morphology <strong>of</strong><br />
selectively grown GaN layers by ammonia-based metalorganic<br />
molecular beam.<br />
S. Naritsuka , C. H. Lin, R. Abe, S. Uchiyama, Y. Uete<br />
and T. Maruyama .<br />
Investigation <strong>of</strong> the local electronic structure <strong>of</strong> Cu-doped<br />
GaN grown by plasma assisted <strong>MBE</strong>.<br />
R. Schuber, P.R. Ganz , F. Wilhelm , A. Rogalev ,<br />
and D.M. Schaadt.<br />
Growth Optimization for InAs/GaSb T2SL Structures by<br />
<strong>MBE</strong>.<br />
Y. X. Song , S. M. Wang, C. Asplund, H. Malm, X. Lu, J. Shao.<br />
MoP15<br />
MoP16<br />
A prototype <strong>of</strong> heterovalent interfaces: Reduction <strong>of</strong> the<br />
potential barrier in the conduction band at the n-ZnSe /<br />
n-GaAs in.<br />
A. Frey, U. Bass, S. Mahapatra, C. Schumacher, J. Geurts<br />
and K. Brunner.<br />
Effect <strong>of</strong> growth temperature on quantum dot laser (Ga,In)<br />
(N,As) self-assembled quantum dots.<br />
O. A. Niasse, M. AL Khalfioui, B. Ba, A. Bèye, M. Leroux.<br />
MoP17<br />
MoP18<br />
Effect <strong>of</strong> different monolayer coverage for the seed layer in<br />
quaternary alloy capped multilayer InAs/GaAs quantum<br />
dot system.<br />
S. Chakrabarti ,A. Mandal and N. Halder .<br />
Neutron reflectometry studies <strong>of</strong> hetero-interfacial H layer<br />
in highly lattice-mismatched epitaxy on Si.<br />
H. Asaoka, T. Yamazaki, D. Yamazaki, M. Takeda<br />
and S. Shamoto.