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FQA9N90C 900V N-Channel MOSFET

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<strong>FQA9N90C</strong><br />

<strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

Features<br />

• 9A, <strong>900V</strong>, R DS(on) = 1.4Ω @V GS = 10 V<br />

• Low gate charge ( typical 45 nC)<br />

• Low Crss ( typical 14pF)<br />

• Fast switching<br />

• 100% avalanche tested<br />

• Improved dv/dt capability<br />

Description<br />

July 2007<br />

QFET ®<br />

These N-<strong>Channel</strong> enhancement mode power field effect<br />

transistors are produced using Fairchild’s proprietary, planar<br />

stripe, DMOS technology.<br />

This advanced technology has been especially tailored to<br />

minimize on-state resistance, provide superior switching<br />

performance, and withstand high energy pulse in the avalanche<br />

and commutation mode. These devices are well suited for high<br />

efficient switched mode power supplies, active power factor<br />

correction, electronic lamp ballast based on half bridge<br />

topology.<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

D<br />

G<br />

Absolute Maximum Ratings<br />

G<br />

D S<br />

TO-3P<br />

FQA Series<br />

S<br />

Symbol Parameter <strong>FQA9N90C</strong> Units<br />

V DSS Drain-Source Voltage 900 V<br />

I D Drain Current - Continuous (T C = 25°C) 9.0 A<br />

Thermal Characteristics<br />

- Continuous (T C = 100°C) 5.7 A<br />

I DM Drain Current - Pulsed (Note 1) 36 A<br />

V GSS Gate-Source Voltage ± 30 V<br />

E AS Single Pulsed Avalanche Energy (Note 2) 900 mJ<br />

I AR Avalanche Current (Note 1) 9.0 A<br />

E AR Repetitive Avalanche Energy (Note 1) 28 mJ<br />

dv/dt Peak Diode Recovery dv/dt (Note 3) 4.0 V/ns<br />

P D Power Dissipation (T C = 25°C) 280 W<br />

- Derate above 25°C 2.22 W/°C<br />

T J , T STG Operating and Storage Temperature Range -55 to +150 °C<br />

T L<br />

Maximum lead temperature for soldering purposes,<br />

1/8 from case for 5 seconds<br />

300 °C<br />

Symbol Parameter Typ Max Units<br />

R θJC Thermal Resistance, Junction-to-Case -- 0.45 °C/W<br />

R θCS Thermal Resistance, Case-to-Sink 0.24 -- °C/W<br />

R θJA Thermal Resistance, Junction-to-Ambient -- 40 °C/W<br />

©2007 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com<br />

<strong>FQA9N90C</strong> Rev. A


Package Marking and Ordering Information<br />

Device Marking Device Package Reel Size Tape Width Quantity<br />

<strong>FQA9N90C</strong> <strong>FQA9N90C</strong> TO-3P -- -- 30<br />

<strong>FQA9N90C</strong> <strong>FQA9N90C</strong>_F109 TO-3PN -- -- 30<br />

Electrical Characteristics T C = 25°C unless otherwise noted<br />

Symbol Parameter Test Conditions Min Typ Max Units<br />

Off Characteristics<br />

BV DSS Drain-Source Breakdown Voltage V GS = 0 V, I D = 250 µA 900 -- -- V<br />

∆BV DSS /<br />

∆T J<br />

Breakdown Voltage Temperature Coefficient I D = 250 µA, Referenced to 25°C -- 0.99 -- V/°C<br />

I DSS Zero Gate Voltage Drain Current V DS = 900 V, V GS = 0 V -- -- 10 µA<br />

V DS = 720 V, T C = 125°C -- -- 100 µA<br />

I GSSF Gate-Body Leakage Current, Forward V GS = 30 V, V DS = 0 V -- -- 100 nA<br />

I GSSR Gate-Body Leakage Current, Reverse V GS = -30 V, V DS = 0 V -- -- -100 nA<br />

On Characteristics<br />

V GS(th) Gate Threshold Voltage V DS = V GS , I D = 250 µA 3.0 -- 5.0 V<br />

R DS(on) Static Drain-Source On-Resistance V GS = 10 V, I D = 4.5 A -- 1.12 1.4 Ω<br />

g FS Forward Transconductance V DS = 50 V, I D = 4.5 A (Note 4) -- 9.2 -- S<br />

Dynamic Characteristics<br />

C iss Input Capacitance V DS = 25 V, V GS = 0 V,<br />

-- 2100 2730 pF<br />

C oss Output Capacitance<br />

f = 1.0 MHz<br />

-- 175 230 pF<br />

C rss Reverse Transfer Capacitance -- 14 18 pF<br />

Switching Characteristics<br />

t d(on)<br />

t r<br />

Turn-On Delay Time<br />

Turn-On Rise Time<br />

V DD = 450 V, I D = 11.0A,<br />

R G = 25 Ω<br />

--<br />

--<br />

50<br />

120<br />

110<br />

250<br />

ns<br />

ns<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

t d(off) Turn-Off Delay Time -- 100 210 ns<br />

(Note 4, 5)<br />

t f Turn-Off Fall Time -- 75 160 ns<br />

Q g Total Gate Charge V DS = 720 V, I D = 11.0A,<br />

-- 45 58 nC<br />

Q gs Gate-Source Charge<br />

V GS = 10 V<br />

-- 13 -- nC<br />

Q gd Gate-Drain Charge<br />

(Note 4, 5)<br />

-- 18 -- nC<br />

Drain-Source Diode Characteristics and Maximum Ratings<br />

I S Maximum Continuous Drain-Source Diode Forward Current -- -- 9.0 A<br />

I SM Maximum Pulsed Drain-Source Diode Forward Current -- -- 36 A<br />

V SD Drain-Source Diode Forward Voltage V GS = 0 V, I S =9.0 A -- -- 1.4 V<br />

t rr Reverse Recovery Time V GS = 0 V, I S = 9.0 A,<br />

-- 550 -- ns<br />

Q rr Reverse Recovery Charge<br />

dI F / dt = 100 A/µs (Note 4)<br />

-- 6.5 -- µC<br />

NOTES:<br />

1. Repetitive Rating : Pulse width limited by maximum junction temperature<br />

2. L = 21mH, I AS =9.0A, V DD = 50V, R G = 25 Ω, Starting T J = 25°C<br />

3. I SD ≤ 9.0A, di/dt ≤200A/µs, V DD ≤ BV DSS, Starting T J = 25°C<br />

4. Pulse Test : Pulse width ≤ 300µs, Duty cycle ≤ 2%<br />

5. Essentially independent of operating temperature<br />

<strong>FQA9N90C</strong> Rev. A<br />

2 www.fairchildsemi.com


Typical Performance Characteristics<br />

Figure 1. On-Region Characteristics<br />

I D<br />

, Drain Current [A]<br />

V GS<br />

Top : 15.0 V<br />

10.0 V<br />

8.0 V<br />

10 1 7.0 V<br />

6.5 V<br />

6.0 V<br />

Bottom : 5.5 V<br />

10 0<br />

10 -1<br />

10 -1 10 0 10 1<br />

V DS<br />

, Drain-Source Voltage [V]<br />

Notes :<br />

1. 250µ s Pulse Test<br />

2. T C = 25<br />

Figure 3. On-Resistance Variation vs.<br />

Drain Current and Gate Voltage<br />

Figure 2. Transfer Characteristics<br />

I D<br />

, Drain Current [A]<br />

10 1 150 o C<br />

10 0<br />

25 o C -55 o C<br />

Notes :<br />

1. V DS = 50V<br />

2. 250µ s Pulse Test<br />

10 -1<br />

2 4 6 8 10<br />

V GS<br />

, Gate-Source Voltage [V]<br />

Figure 4. Body Diode Forward Voltage<br />

Variation vs. Source Current<br />

and Temperatue<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

3.0<br />

R DS(ON)<br />

[Ω ],<br />

Drain-Source On-Resistance<br />

2.5<br />

2.0<br />

1.5<br />

V GS<br />

= 20V<br />

V GS<br />

= 10V<br />

Note : T = 25<br />

J<br />

I DR<br />

, Reverse Drain Current [A]<br />

10 1<br />

10 0<br />

150<br />

25<br />

Notes :<br />

1. V GS = 0V<br />

2. 250µ s Pulse Test<br />

1.0<br />

0 5 10 15 20 25 30<br />

I D<br />

, Drain Current [A]<br />

10 -1<br />

0.2 0.4 0.6 0.8 1.0 1.2 1.4<br />

V SD<br />

, Source-Drain voltage [V]<br />

Figure 5. Capacitance Characteristics<br />

Figure 6. Gate Charge Characteristics<br />

3500<br />

3000<br />

12<br />

10<br />

V DS<br />

= 180V<br />

V DS<br />

= 450V<br />

Capacitance [pF]<br />

2500<br />

2000<br />

1500<br />

1000<br />

500<br />

C iss<br />

C oss<br />

C rss<br />

C iss = C gs + C gd (C ds = shorted)<br />

C oss = C ds + C gd<br />

C rss = C gd<br />

Notes :<br />

1. V GS = 0 V<br />

2. f = 1 MHz<br />

V GS<br />

, Gate-Source Voltage [V]<br />

8<br />

6<br />

4<br />

2<br />

V DS<br />

= 720V<br />

Note : I = 9A D<br />

0<br />

10 -1 10 0 10 1<br />

V DS<br />

, Drain-Source Voltage [V]<br />

0<br />

0 10 20 30 40 50<br />

Q G<br />

, Total Gate Charge [nC]<br />

<strong>FQA9N90C</strong> Rev. A<br />

3 www.fairchildsemi.com


Typical Performance Characteristics (Continued)<br />

Figure 7. Breakdown Voltage Variation<br />

vs. Temperature<br />

BV DSS<br />

, (Normalized)<br />

Drain-Source Breakdown Voltage<br />

1.2<br />

1.1<br />

1.0<br />

0.9<br />

Notes :<br />

1. V GS<br />

= 0 V<br />

2. I D<br />

= 250 µA<br />

Figure 8. On-Resistance Variation<br />

vs. Temperature<br />

R DS(ON)<br />

, (Normalized)<br />

Drain-Source On-Resistance<br />

3.0<br />

2.5<br />

2.0<br />

1.5<br />

1.0<br />

0.5<br />

Notes :<br />

1. V GS = 10 V<br />

2. I D = 4.5 A<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

0.8<br />

-100 -50 0 50 100 150 200<br />

T J<br />

, Junction Temperature [ o C]<br />

Figure 9. Maximum Safe Operating Area<br />

0.0<br />

-100 -50 0 50 100 150 200<br />

T J<br />

, Junction Temperature [ o C]<br />

Figure 10. Maximum Drain Current<br />

vs. Case Temperature<br />

2 Operation in This Area<br />

10 is Limited by R DS(on)<br />

10 µs<br />

10<br />

I D<br />

, Drain Current [A]<br />

10 1<br />

10 0<br />

1 ms<br />

10 ms<br />

DC<br />

100 µs<br />

I D<br />

, Drain Current [A]<br />

8<br />

6<br />

4<br />

10 -1<br />

Notes :<br />

1. T C = 25 o C<br />

2. T J = 150 o C<br />

3. Single Pulse<br />

2<br />

10 -2<br />

10 0 10 1 10 2 10 3<br />

V DS<br />

, Drain-Source Voltage [V]<br />

0<br />

25 50 75 100 125 150<br />

T C<br />

, Case Temperature [ ]<br />

Figure 11. Transient Thermal Response Curve<br />

Z θ JC<br />

(t), Thermal Response<br />

10 -1<br />

10 -2<br />

D=0.5<br />

0.2<br />

0.1<br />

0.05<br />

0.02<br />

0.01<br />

10 0 Notes :<br />

single pulse<br />

<br />

1. Z θ JC (t) = 0.45 /W Max.<br />

2. Duty Factor, D=t 1 /t 2<br />

3. T JM - T C = P DM * Z θ JC (t)<br />

P DM<br />

t 1<br />

t 2<br />

10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1<br />

t 1<br />

, Square Wave Pulse Duration [sec]<br />

<strong>FQA9N90C</strong>Rev. A<br />

4 www.fairchildsemi.com


Gate Charge Test Circuit & Waveform<br />

<strong>FQA9N90C</strong> F109 <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

Resistive Switching Test Circuit & Waveforms<br />

Unclamped Inductive Switching Test Circuit & Waveforms<br />

<strong>FQA9N90C</strong> Rev. A<br />

5 www.fairchildsemi.com


Peak Diode Recovery dv/dt Test Circuit & Waveforms<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

<strong>FQA9N90C</strong> Rev. A<br />

6 www.fairchildsemi.com


Mechanical Dimensions<br />

15.60 ±0.20<br />

13.60 ±0.20<br />

ø3.20 ±0.10<br />

9.60 ±0.20<br />

13.90 ±0.20<br />

TO-3P<br />

12.76 ±0.20<br />

3.80 ±0.20<br />

19.90 ±0.20<br />

23.40 ±0.20<br />

18.70 ±0.20<br />

4.80 ±0.20<br />

1.50 +0.15<br />

–0.05<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

2.00 ±0.20<br />

3.00 ±0.20<br />

1.00 ±0.20<br />

3.50 ±0.20<br />

16.50 ±0.30<br />

1.40 ±0.20<br />

5.45TYP<br />

[5.45 ±0.30]<br />

5.45TYP<br />

[5.45 ±0.30]<br />

0.60 +0.15<br />

–0.05<br />

Dimensions in Millimeters<br />

<strong>FQA9N90C</strong> Rev. A<br />

7 www.fairchildsemi.com


Mechanical Dimensions (Continued)<br />

TO-3PN<br />

<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

Dimensions in Millimeters<br />

<strong>FQA9N90C</strong> Rev. A<br />

8 www.fairchildsemi.com


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<strong>FQA9N90C</strong> <strong>900V</strong> N-<strong>Channel</strong> <strong>MOSFET</strong><br />

DISCLAIMER<br />

FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO<br />

IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE<br />

OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE<br />

RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS,<br />

SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.<br />

LIFE SUPPORT POLICY<br />

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT<br />

THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.<br />

As used herein:<br />

1. Life support devices or systems are devices or systems which,<br />

(a) are intended for surgical implant into the body or (b) support<br />

or sustain life, and (c) whose failure to perform when properly<br />

used in accordance with instructions for use provided in the<br />

labeling, can be reasonably expected to result in a significant<br />

injury of the user.<br />

2. A critical component in any component of a life support,<br />

device, or system whose failure to perform can be reasonably<br />

expected to cause the failure of the life support device or system,<br />

or to affect its safety or effectiveness.<br />

PRODUCT STATUS DEFINITIONS<br />

Definition of Terms<br />

Datasheet Identification Product Status Definition<br />

Advance Information Formative or In Design This datasheet contains the design specifications for product<br />

development. Specifications may change in any manner without notice.<br />

Preliminary First Production This datasheet contains preliminary data; supplementary data will be<br />

published at a later date. Fairchild Semiconductor reserves the right to<br />

make changes at any time without notice to improve design.<br />

No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor<br />

reserves the right to make changes at any time without notice to<br />

improve design.<br />

Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued<br />

by Fairchild Semiconductor.The datasheet is printed for reference<br />

information only.<br />

Rev. I29<br />

<strong>FQA9N90C</strong> A<br />

9 www.fairchildsemi.com

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