08.07.2014 Views

FDD7N20/FDU7N20 N-Channel MOSFET

FDD7N20/FDU7N20 N-Channel MOSFET

FDD7N20/FDU7N20 N-Channel MOSFET

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

<strong>FDD7N20</strong> / <strong>FDU7N20</strong><br />

N-<strong>Channel</strong> <strong>MOSFET</strong><br />

200V, 5A, 0.69Ω<br />

Features<br />

• R DS(on) = 0.58Ω ( Typ. ) @ V GS = 10V, I D = 2.5A<br />

• Low gate charge( Typ. 5nC )<br />

• Low Crss ( Typ. 5pF )<br />

• Fast switching<br />

• 100% avalanche tested<br />

• Improved dv/dt capability<br />

• RoHS compliant<br />

G<br />

S<br />

D<br />

D-PAK<br />

FDD Series<br />

G D S<br />

Description<br />

April 2007<br />

UniFET TM<br />

tm<br />

These N-<strong>Channel</strong> enhancement mode power field effect<br />

transistors are produced using Fairchild’s proprietary, planar<br />

stripe, DMOS technology.<br />

This advanced technology has been especically tailored to<br />

minimize on-state resistance, provide superior switching<br />

performance, and withstand high energy pulse in the avalanche<br />

and commutation mode. These devices are well suited for high<br />

efficient switched mode power supplies and active power factor<br />

correction.<br />

I-PAK<br />

FDU Series<br />

G<br />

D<br />

S<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

<strong>MOSFET</strong> Maximum Ratings T C = 25 o C unless otherwise noted<br />

Symbol Parameter Ratings Units<br />

V DSS Drain to Source Voltage 200 V<br />

V GSS Gate to Source Voltage ±30 V<br />

I D<br />

Drain Current<br />

-Continuous (T C = 25 o C) 5<br />

-Continuous (T C = 100 o C) 3<br />

A<br />

I DM Drain Current - Pulsed (Note 1) 15 A<br />

E AS Single Pulsed Avalanche Energy (Note 2) 62.5 mJ<br />

I AR Avalanche Current (Note 1) 5 A<br />

E AR Repetitive Avalanche Energy (Note 1) 4.3 mJ<br />

dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns<br />

P D<br />

Power Dissipation<br />

(T C = 25 o C) 43 W<br />

- Derate above 25 o C 0.34 W/ o C<br />

T J , T STG Operating and Storage Temperature Range -55 to +150 o C<br />

T L<br />

Maximum Lead Temperature for Soldering Purpose,<br />

1/8” from Case for 5 Seconds<br />

300 o C<br />

Thermal Characteristics<br />

Symbol Parameter Ratings Units<br />

R θJC Thermal Resistance, Junction to Case 2.9<br />

o C/W<br />

R θJA Thermal Resistance, Junction to Ambient 110<br />

©2007 Fairchild Semiconductor Corporation<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

1<br />

www.fairchildsemi.com


Package Marking and Ordering Information T C = 25 o C unless otherwise noted<br />

Device Marking Device Package Reel Size Tape Width Quantity<br />

<strong>FDD7N20</strong> <strong>FDD7N20</strong>TM D-PAK 380mm 16mm 2500<br />

<strong>FDD7N20</strong> <strong>FDD7N20</strong>TF D-PAK 380mm 16mm 2000<br />

<strong>FDU7N20</strong> <strong>FDU7N20</strong> I-PAK - - 70<br />

Electrical Characteristics<br />

Symbol Parameter Test Conditions Min. Typ. Max. Units<br />

Off Characteristics<br />

BV DSS Drain to Source Breakdown Voltage I D = 250μA, V GS = 0V, T J = 25 o C 200 - - V<br />

ΔBV DSS Breakdown Voltage Temperature<br />

I<br />

/ ΔT J Coefficient<br />

D = 250μA, Referenced to 25 o C - 0.2 - V/ o C<br />

V<br />

I DSS<br />

Zero Gate Voltage Drain Current<br />

DS = 200V, V GS =0V - - 1 μA<br />

V DS = 160V, T C = 125 o C - - 10 μA<br />

I GSS Gate to Body Leakage Current V GS = ±30V, V DS = 0V - - ±100 nA<br />

On Characteristics<br />

V GS(th) Gate Threshold Voltage V GS = V DS , I D = 250μA 3.0 - 5.0 V<br />

R DS(on) Static Drain to Source On Resistance V GS = 10V, I D = 2.5A - 0.58 0.69 Ω<br />

g FS Forward Transconductance V DS = 40V, I D = 2.5A (Note 4) - 6.2 - S<br />

Dynamic Characteristics<br />

C iss<br />

Input Capacitance<br />

- 185 250 pF<br />

V DS = 25V, V GS = 0V<br />

C oss Output Capacitance - 45 65 pF<br />

f = 1MHz<br />

C rss Reverse Transfer Capacitance - 5 10 pF<br />

Q g<br />

Total Gate Charge at 10V<br />

- 5 6.7 nC<br />

Q gs Gate to Source Gate Charge V DS = 160V, I D = 7A<br />

- 1.7 - nC<br />

V GS = 10V<br />

Q gd Gate to Drain “Miller” Charge (Note 4, 5) - 2.4 - nC<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

Switching Characteristics<br />

t d(on) Turn-On Delay Time<br />

- 9 28 ns<br />

t r Turn-On Rise Time V DD = 100V, I D = 7A<br />

- 30 70 ns<br />

t d(off) Turn-Off Delay Time<br />

R G = 25Ω<br />

- 13 36 ns<br />

t f Turn-Off Fall Time (Note 4, 5) - 10 30 ns<br />

Drain-Source Diode Characteristics<br />

I S Maximum Continuous Drain to Source Diode Forward Current - - 5 A<br />

I SM Maximum Pulsed Drain to Source Diode Forward Current - - 20 A<br />

V SD Drain to Source Diode Forward Voltage V GS = 0V, I SD = 5A - - 1.4 V<br />

t rr Reverse Recovery Time V GS = 0V, I SD = 7A<br />

- 120 - ns<br />

Q rr Reverse Recovery Charge dI F /dt = 100A/μs (Note 4) - 0.4 - μC<br />

Notes:<br />

1. Repetitive Rating: Pulse width limited by maximum junction temperature<br />

2. L =5mH, I AS = 5A, V DD = 50V, R G = 25Ω, Starting T J = 25°C<br />

3. I SD ≤ 5A, di/dt ≤ 200A/μs, V DD ≤ BV DSS , Starting T J = 25°C<br />

4. Pulse Test: Pulse width ≤ 300μs, Duty Cycle ≤ 2%<br />

5. Essentially Independent of Operating Temperature Typical Characteristics<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

2<br />

www.fairchildsemi.com


Typical Performance Characteristics<br />

ID,Drain Current[A]<br />

Figure 1. On-Region Characteristics<br />

20<br />

10<br />

1<br />

0.1<br />

V GS = 10.0 V<br />

8.0 V<br />

7.0 V<br />

6.5 V<br />

6.0 V<br />

5.5 V<br />

Figure 2. Transfer Characteristics<br />

* Notes :<br />

* Notes :<br />

1. 250μs Pulse Test<br />

2. T C = 25 o 1. V DS = 25V<br />

C<br />

2. 250μs Pulse Test<br />

0.01<br />

1<br />

0.04 0.1 1 10 25<br />

4 6 8 10 12<br />

V DS ,Drain-Source Voltage[V]<br />

V GS ,Gate-Source Voltage[V]<br />

Figure 3. On-Resistance Variation vs.<br />

Figure 4. Body Diode Forward Voltage<br />

Drain Current and Gate Voltage Variation vs. Source Current<br />

and Temperature<br />

1.5<br />

ID,Drain Current[A]<br />

20<br />

10<br />

200<br />

100<br />

25 o C<br />

150 o C<br />

-55 o C<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

RDS(ON) [Ω],<br />

Drain-Source On-Resistance<br />

1.2<br />

0.9<br />

0.6<br />

V GS = 10V<br />

V GS = 20V<br />

* Note : T J = 25 o C<br />

0.3<br />

0 2 4 6 8 10<br />

I D , Drain Current [A]<br />

IS, Reverse Drain Current [A]<br />

10<br />

1<br />

150 o C<br />

25 o C<br />

Notes:<br />

1. V GS<br />

= 0V<br />

2. 250μs Pulse Test<br />

0.2<br />

0.0 0.7 1.4 2.1 2.8 3.5<br />

V SD<br />

, Body Diode Forward Voltage [V]<br />

Capacitances [pF]<br />

Figure 5. Capacitance Characteristics<br />

500<br />

400<br />

300<br />

200<br />

100<br />

C oss<br />

C iss<br />

C rss<br />

Ciss = Cgs + Cgd (Cds = shorted)<br />

Coss = Cds + Cgd<br />

Crss = Cgd<br />

* Note:<br />

1. V GS = 0V<br />

2. f = 1MHz<br />

Figure 6. Gate Charge Characteristics<br />

VGS, Gate-Source Voltage [V]<br />

10<br />

8<br />

V DS = 160V<br />

6<br />

V DS = 100V<br />

V DS = 50V<br />

4<br />

2<br />

0<br />

0.1 1 10<br />

V DS , Drain-Source Voltage [V]<br />

* Note : I D = 7A<br />

0<br />

30 0 1 2 3 4 5 6<br />

Q g , Total Gate Charge [nC]<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

3<br />

www.fairchildsemi.com


Typical Performance Characteristics (Continued)<br />

BVDSS, [Normalized]<br />

Drain-Source Breakdown Voltage<br />

ID, Drain Current [A]<br />

Figure 7. Breakdown Voltage Variation<br />

vs. Temperature<br />

1.2<br />

1.1<br />

1.0<br />

0.9<br />

* Notes :<br />

1. V GS = 0V<br />

2. I D = 250μA<br />

0.8<br />

-100 -50 0 50 100 150 200<br />

T J , Junction Temperature [ o C]<br />

Figure 9. Maximum Safe Operating Area<br />

50<br />

10<br />

1<br />

0.1<br />

Operation in This Area<br />

is Limited by R DS(on)<br />

* Notes :<br />

1. T C = 25 o C<br />

2. T J = 150 o C<br />

3. Single Pulse<br />

0.01<br />

1 10 100<br />

V DS , Drain-Source Voltage [V]<br />

20μs<br />

100μs<br />

1ms<br />

10ms<br />

DC<br />

500<br />

RDS(on), [Normalized]<br />

Drain-Source On-Resistance<br />

Figure 8. On-Resistance Variation<br />

vs. Temperature<br />

3.0<br />

2.5<br />

2.0<br />

1.5<br />

1.0<br />

0.5<br />

* Notes :<br />

1. V GS = 10V<br />

2. I D = 2.5A<br />

0.0<br />

-100 -50 0 50 100 150 200<br />

T J , Junction Temperature [ o C]<br />

Figure 10. Maximum Drain Current<br />

vs. Case Temperature<br />

ID, Drain Current [A]<br />

6<br />

5<br />

4<br />

3<br />

2<br />

1<br />

0<br />

25 50 75 100 125 150<br />

T C , Case Temperature [ o C]<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

Figure 11. Transient Thermal Response Curve<br />

5<br />

Thermal Response [Z θJC ]<br />

1<br />

0.1<br />

0.5<br />

0.2<br />

0.1<br />

0.05<br />

0.02<br />

0.01<br />

P DM<br />

t 1<br />

t 2<br />

* Notes :<br />

1. Z θJC (t) = 2.9 o C/W Max.<br />

Single pulse<br />

2. Duty Factor, D=t 1 /t 2<br />

3. T JM - T C = P DM * Z θJC (t)<br />

0.01<br />

10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1<br />

Rectangular Pulse Duration [sec]<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

4<br />

www.fairchildsemi.com


Gate Charge Test Circuit & Waveform<br />

Resistive Switching Test Circuit & Waveforms<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

Unclamped Inductive Switching Test Circuit & Waveforms<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

5<br />

www.fairchildsemi.com


Peak Diode Recovery dv/dt Test Circuit & Waveforms<br />

D U T<br />

+<br />

I S D<br />

V D<br />

S<br />

_<br />

L<br />

D<br />

r iv e r<br />

R G S a m e T y p e<br />

a s D U<br />

T<br />

V G S • d v / d t c o n t r o lle d b y R G<br />

• I S D c o n t r o lle d b y p u ls e p e r io d<br />

V D<br />

D<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

V G<br />

S<br />

( D riv e r )<br />

G a t e P u ls e W id t h<br />

D =<br />

--------------------------<br />

G<br />

a t e P u ls e P e r io d<br />

1 0 V<br />

I F M , B o d y D io d e F o r w a r d C u r r e n t<br />

I S D<br />

( D U T )<br />

d i/ d t<br />

I R<br />

M<br />

B o d y D io d e R e v e r s e C u r r e n t<br />

V D<br />

S<br />

( D U T )<br />

B o d y D io d e R e c o v e r y d v / d t<br />

V S D<br />

V D<br />

D<br />

B o d y D<br />

io d e<br />

F o r w a r d V o lt a g e D r o p<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

6<br />

www.fairchildsemi.com


Mechanical Dimensions<br />

D-PAK<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

7<br />

www.fairchildsemi.com


Mechanical Dimensions<br />

I-PAK<br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> 200V N-<strong>Channel</strong> <strong>MOSFET</strong><br />

<strong>FDD7N20</strong> / <strong>FDU7N20</strong> Rev. A<br />

8<br />

www.fairchildsemi.com


TRADEMARKS<br />

The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and is not<br />

intended to be an exhaustive list of all such trademarks.<br />

ACEx ®<br />

Build it Now<br />

CorePLUS<br />

CROSSVOLT<br />

CTL<br />

Current Transfer Logic<br />

EcoSPARK ®<br />

FACT Quiet Series<br />

FACT ®<br />

FAST ®<br />

FastvCore<br />

FPS<br />

FRFET ®<br />

Global Power Resource SM<br />

Green FPS<br />

Green FPS e-Series<br />

GTO<br />

i-Lo<br />

IntelliMAX<br />

ISOPLANAR<br />

MegaBuck<br />

MICROCOUPLER<br />

MicroPak<br />

Motion-SPM<br />

OPTOLOGIC ®<br />

OPTOPLANAR ®<br />

PDP-SPM<br />

Power220 ®<br />

Power247 ®<br />

POWEREDGE ®<br />

Power-SPM<br />

PowerTrench ®<br />

Programmable Active Droop<br />

QFET ®<br />

QS<br />

QT Optoelectronics<br />

Quiet Series<br />

RapidConfigure<br />

SMART START<br />

SPM ®<br />

STEALTH<br />

SuperFET<br />

SuperSOT-3<br />

SuperSOT-6<br />

SuperSOT-8<br />

SyncFET<br />

The Power Franchise ®<br />

<br />

TinyBoost<br />

TinyBuck<br />

TinyLogic ®<br />

TINYOPTO<br />

TinyPower<br />

TinyPWM<br />

TinyWire<br />

μSerDes<br />

UHC ®<br />

UniFET<br />

VCX<br />

DISCLAIMER<br />

FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS<br />

HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE<br />

APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS<br />

PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S<br />

WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.<br />

LIFE SUPPORT POLICY<br />

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR<br />

SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.<br />

As used herein:<br />

1. Life support devices or systems are devices or systems<br />

which, (a) are intended for surgical implant into the body or<br />

(b) support or sustain life, and (c) whose failure to perform<br />

when properly used in accordance with instructions for use<br />

provided in the labeling, can be reasonably expected to<br />

result in a significant injury of the user.<br />

2. A critical component in any component of a life support,<br />

device, or system whose failure to perform can be<br />

reasonably expected to cause the failure of the life support<br />

device or system, or to affect its safety or effectiveness.<br />

PRODUCT STATUS DEFINITIONS<br />

Definition of Terms<br />

Datasheet Identification Product Status Definition<br />

Advance Information Formative or In Design This datasheet contains the design specifications for product<br />

development. Specifications may change in any manner without notice.<br />

Preliminary First Production This datasheet contains preliminary data; supplementary data will be<br />

published at a later date. Fairchild Semiconductor reserves the right to<br />

make changes at any time without notice to improve design.<br />

No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor<br />

reserves the right to make changes at any time without notice to improve<br />

design.<br />

Obsolete Not In Production This datasheet contains specifications on a product that has been<br />

discontinued by Fairchild Semiconductor. The datasheet is printed for<br />

reference information only.<br />

Rev. I28<br />

© 2007 Fairchild Semiconductor Corporation www.fairchildsemi.com

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!