2012 Corporate Capabilities - Spectroscopy

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50 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com EDAX, Inc. eDAx, Inc. 91 McKee Drive Mahwah, NJ 07430 Telephone (201) 529-4880 FAx (201) 529-3156 e-mAIl info@amtek.com Web sITe www.edax.com yeAr FounDeD 1962 Company Description EDAX, Inc. is an ISO-9001 certified manufacturer with over 50 years of experience building instrumentation for the elemental and structural analysis of materials. EDAX’s founding technology was the detection and measurement of fluorescent X-rays for qualitative and quantitative elemental analysis — for example, elemental analysis on electron beam microscopes. Since that time, EDAX has sought to expand our product offering through new technologies and complementary techniques to provide our customers with the latest analytical instrumentation available. EDAX continues to be a world leader in materials analysis providing both stand-alone micro-XRF systems and microscopemounted tools. Chief Spectroscopic Techniques Supported ⦁ Energy dispersive spectroscopy ⦁ Energy dispersive X-ray fluorescence ⦁ Electron back scatter diffraction ⦁ Wavelength dispersive spectroscopy Markets Served EDAX instrumentation for elemental and structural analysis is found in a broad spectrum of industrial, academic, and government applications from the field or warehouse to the most advanced research and development laboratory. Typical markets served include semiconductor and microelectronics, academic, and industrial R&D laboratories, ROHS/WEEE, renewable energy, pharmaceuticals, mining, security, forensics, catalysts, petrochemicals, metallurgy, and manufacturing operations. Major Products/Services ⦁ Energy dispersive X-ray fluorescence: EDAX manufactures micro XRF analyzers for the laboratory. ⦁ Electron backscatter diffraction: EDAX supplies instrumentation for materials structural analysis on SEM electronbeam microscopes. ⦁ Energy dispersive spectroscopy: EDAX provides a full range of EDS products for elemental analysis on SEM and TEM electron-beam microscopes. ⦁ Wavelength dispersive spectroscopy: EDAX offers parallel beam WDS products for elemental analysis on SEM electron-beam microscopes. ⦁ Fluorescent X-ray detectors: EDAX supplies Si(Li) detectors and silicon drift detectors, which are capable of handling count rates of over 1,000,000 cps and parallel beam wavelength dispersive spectrometers. Facilities EDAX headquarters is located in Mahwah, New Jersey, housing sales, technical support, and manufacturing operations. EDAX is committed to providing the best possible support for our customers worldwide with sales, service, and applications support offices located in Japan, China, Singapore, The Netherlands, Germany, the United Kingdom, and the United States.
is Puts a New Spin on Micro XRF Analysis Versatility on-Destructive Micro to Millimeter Spot Elemental Analysis Using Primary Beam Filters on a Wide Range of Sample Types Forensics Trace Evidence, Solids, Residues, Powders, Liquids Industrial RoHS-WEEE, Quality Control, Failure Analysis, Coating Thickness/Composition Antiquities/Museum Artifact Authentication, Gemstones, Documents
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