Podium Presentation Template - Semiconductor Wafer Test Workshop
Podium Presentation Template - Semiconductor Wafer Test Workshop
Podium Presentation Template - Semiconductor Wafer Test Workshop
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BeCu Pointed<br />
Saber ® Probe Properties<br />
Beryllium<br />
1.9%<br />
BeCu<br />
Copper<br />
98%<br />
Pointed Probe<br />
Chemically<br />
etched, no<br />
inherent stress<br />
Huge cross section<br />
•Current Capacity at 25 0 C :<br />
•Current Required to “Blow” :<br />
•Resistivity:<br />
•Conductivity @ 20 0 C :<br />
600 mA for 2 minutes<br />
1,300 mA<br />
7.0 uohm–cm<br />
.129 1Mohm–cm<br />
June 8 to 11, 2008<br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 19
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