Podium Presentation Template - Semiconductor Wafer Test Workshop
Podium Presentation Template - Semiconductor Wafer Test Workshop
Podium Presentation Template - Semiconductor Wafer Test Workshop
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Design Objective<br />
Gussets<br />
Head Plate<br />
<strong>Test</strong> Head Direct Dock<br />
0.120 inches<br />
Fewer interconnects, decrease<br />
the signal path length across a<br />
probe card PCB to actual probe<br />
needle connection.<br />
3.03<br />
mm<br />
Probe<br />
Application<br />
HW<br />
June 8 to 11, 2008<br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 6
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