Podium Presentation Template - Semiconductor Wafer Test Workshop
Podium Presentation Template - Semiconductor Wafer Test Workshop
Podium Presentation Template - Semiconductor Wafer Test Workshop
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Analog Devices, Inc.<br />
<strong>Test</strong> Needs<br />
• High performance linear & mixed signal testing<br />
• Lowest cost per touchdown for vertical design<br />
• Low inductance paths for high frequency signals<br />
• Higher frequency than cantilever can provide<br />
• Provide the technical and production test<br />
benefits of vertical at a cost closer to cantilever<br />
• Minimize scrub marks for automotive products<br />
June 8 to 11, 2008<br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 4
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