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njit-etd2000-029 - New Jersey Institute of Technology

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23<br />

1.1.2.6 Transport Phenomena: Fluid flow, heat transfer, and mass transfer are all<br />

characterized under transport phenomena. Transport phenomena govern the access <strong>of</strong><br />

film precursors to the substrate and influence the degree <strong>of</strong> desirable and unwanted gasphase<br />

reactions taking place before deposition. The complex reactor geometries and large<br />

thermal gradients <strong>of</strong> CVD reactors lead to a wide variety <strong>of</strong> flow structures impacting film<br />

thickness and composition uniformity, as well as impurity levels. Direct observation <strong>of</strong><br />

flow is difficult because <strong>of</strong> a lack <strong>of</strong> a suitable visualization technique for many systems<br />

and because <strong>of</strong> practical constraints such as no optical access and possible contamination<br />

<strong>of</strong> a production reactor. Therefore, experimental observations and approximately chosen<br />

computer models are employed on individual systems 35 .<br />

The sequential steps <strong>of</strong> deposition process can be grouped into (i) mass transport-limited<br />

regime and (ii) surface-reaction-limited regime. If the mass transfer limits the deposition<br />

process, the transport process occurred by the gas-phase diffusion is proportional to the<br />

diffusivity <strong>of</strong> the gas and the concentration gradient. The mass transport process that limits<br />

the growth rate is only weakly dependent on temperature. On the other hand, it is very<br />

important that the same concentration <strong>of</strong> reactants be present in the bulk gas regions<br />

adjacent to all locations <strong>of</strong> a wafer, as the arrival rate is directly proportional to the<br />

concentration in the bulk gas. Thus, to ensure films <strong>of</strong> uniform thickness, reactors that are<br />

operated in the mass-transport-limited regime must be designed so that all locations <strong>of</strong><br />

wafer surfaces and all wafers in a run are supplied with an equal flux <strong>of</strong> reactant species.

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