2012-2016 Microsystem Technology Strategy and Roadmaps

Test, Measurement, Designfor-Test
(DFT) Priorities
Focus on provision of tools and methodologies aligned with
testing and measurement required to support R&D involving
microsystems and constituent technologies
– Verification, validation and characterization
– Hardware, software, embedded systems, integrated systems
Themes are drawn from “parent” roadmaps,
encompassing:
– Test capabilities driven by More Moore (speed, frequency, complexity, power)
– Harsh environment (temperature, power, radiation, etc.) testing for components and systems
– 3D linked TSV and other interconnect technologies for heterogeneous or hybrid integration;
DFT methodologies
– Interconnect architectures (emerging standards) and smart fixtures to enable testability
(wafer level, advanced probing, manufacturing oriented, reconfigurable)
How:
– CMC test equipment lending pool
– Enabling access to test facilities. E.g. NMPTC, other university labs
– System-level development platforms
– Provision of CAD tools supporting DFT
© 2012, CMC Microsystems Strategy and Roadmap, Work in Progress 32