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Journal of Reliable Power - SEL

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A. Simple Reactance Method<br />

From Figure 4, the voltage drop from the S end <strong>of</strong> the line<br />

is:<br />

VS = m • Z1L • IS + R F • IF<br />

(1)<br />

For an A-phase to ground fault, Vs = V a−g and I S = Ia + k • 3• I0<br />

The goal is to minimize the effect <strong>of</strong> the R F • IF<br />

term.<br />

The simple reactance method divides all terms by I S (I<br />

measured at the fault locator) and ignores the (R F •I F / I S ) term.<br />

To do this, save the imaginary part, and solve for m:<br />

( )<br />

Im V /I = Im(m • Z ) = m • X<br />

S S 1L 1L<br />

m =<br />

I<br />

m<br />

⎛ VS<br />

⎞<br />

⎜<br />

⎝ I ⎟<br />

⎠<br />

X<br />

1L<br />

Error is 0 if ∠ I = ∠ I or R = 0<br />

S<br />

S F F<br />

B. Takagi Method—One-Ended Impedance Method With No<br />

Source Data<br />

The Takagi method requires prefault and fault data. It<br />

improves upon the simple reactance method [2] by reducing<br />

the effect <strong>of</strong> load flow and minimizing the effect <strong>of</strong> fault<br />

resistance.<br />

VS = m • Z 1L • I + R F • IF<br />

(3)<br />

Use Superposition current (I sup ) to find a term in phase with<br />

I F :<br />

Isup<br />

= I − Ipre<br />

I = Fault Current<br />

(4)<br />

I = Pre-fault Current<br />

pre<br />

Voltage drop from Bus S:<br />

VS = m • Z 1L • IS + R F • IF<br />

Multiply both sides <strong>of</strong> equation (1) by the complex<br />

conjugate <strong>of</strong> I sup (I sup* ) and save the imaginary part. Then,<br />

solve for m:<br />

I m[VS • I sup* ] = m • I m (Z1L • IS • I sup* ) + R F • I m (IF • I sup* )<br />

I m (VS • I sup* )<br />

(5)<br />

m = I (Z • I • I )<br />

m 1L S sup*<br />

The key to the success <strong>of</strong> the Takagi method is that the<br />

angle <strong>of</strong> I S is the same as the angle <strong>of</strong> I F . For an ideal<br />

homogeneous system, these angles are identical. As the angle<br />

between I S and I F increases, the error in the fault location<br />

estimate increases.<br />

(2)<br />

C. Modified Takagi—Zero-Sequence Current Method with<br />

Angle Correction<br />

Another method (modified Takagi) uses zero-sequence<br />

current (3 • I 0S ) for ground faults instead <strong>of</strong> the superposition<br />

current. Therefore, this method requires no prefault data.<br />

Modified Takagi also allows for angle correction. If the<br />

user knows the system source impedances, the zero-sequence<br />

current can be adjusted by angle T to improve the fault<br />

location estimate for a given line.<br />

* − jT<br />

( ( ) )<br />

−<br />

( )<br />

Im V S • 3• I 0S • e<br />

m = (6)<br />

I Z • I • 3• I • e<br />

* jT<br />

( )<br />

m 1L S 0S<br />

The angle T selected will be valid for one fault location<br />

along the line. Figure 5 shows how to calculate T.<br />

Z 0S<br />

Figure 5<br />

known)<br />

3•I RS<br />

mZ 0L<br />

T<br />

3• I RS<br />

I F<br />

I F<br />

(1-m)Z 0L<br />

Zero-Sequence Current Angle Correction (if source impedances are<br />

IF<br />

Z0S + Z0L + Z0R<br />

= = A∠T<br />

3• I (1− m) • Z + Z<br />

RS 0L 0R<br />

D. Two-Ended Negative-Sequence Impedance Method<br />

A relatively new method, introduced in 1999, uses<br />

negative-sequence quantities from all line terminals for the<br />

location <strong>of</strong> unbalanced faults. By using negative-sequence<br />

quantities, we negate the effect <strong>of</strong> prefault load and fault<br />

resistance, zero-sequence mutual impedance, and zerosequence<br />

infeed from transmission line taps. Precise fault type<br />

selection is not necessary. Data alignment is not required<br />

because the algorithm employed at each line end uses the<br />

following quantities from the remote terminal (which do not<br />

require phase alignment).<br />

• Magnitude <strong>of</strong> negative-sequence current, I2<br />

• Calculated negative-sequence source impedance,<br />

Z ∠θ<br />

°<br />

2<br />

2<br />

Z 0R<br />

(7)<br />

Impedance-Based Fault Location Experience | 17

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