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Microcomputer Unit - Index of

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QUALITY ASSURANCEstances such as temperature, humidity and dust,and the control <strong>of</strong> submaterials, like gas, and purewater used in a manufacturing process, are intensivelyexecuted.Dust control is essential to realize higher integrationand higher reliability <strong>of</strong> devices. At Hitachi,maintenance and improvement <strong>of</strong> cleanliness atmanufacturing sites is accomplished throughattention to buildings, facilities, air conditioningsystems, delivered materials, clothes, work environment,and periodic inspection <strong>of</strong> floating dustconcentration.3.3.3 Final Product Inspection and ReliabilityAssurance(1) Final Product InspectionLot inspection is done by the quality assuranceProcess Control Point Purpose <strong>of</strong> ControlPurchase <strong>of</strong> Materialwafer~ Wafer Characteristics, Appearance Scratch, Removal <strong>of</strong> CrystalDefect Wafer, Surface Oxidation Oxidation Assurance <strong>of</strong> ResistanceInspection on Surface Appearance, Thickness <strong>of</strong> Pinhole, ScratchOxidationOxide FilmPhoto ResistPhotoResistInspection on Photo Resist Dimension, Appearance Dimension Level PQC Level Check Check <strong>of</strong> Photo ResistDiffusion Diffusion Diffusion Depth, Sheet Diffusion StatusResistanceInspection on Diffusion Gate Width Control <strong>of</strong> Basic Parameters PQC Level Check Characteristics <strong>of</strong> Oxide Film (VTH, etc.) Cleanness <strong>of</strong> surface,Breakt.!own VoltagePrior Check <strong>of</strong> VIHBreakdown Voltage CheckEvaporation Evapora- Thickness <strong>of</strong> Vapor Film, Assurance <strong>of</strong> Standardtion Scratch, Contamination ThicknessInspection on Evaporation PQC Level CheckWafer Inspection Wafer Thickness, VTH Characteris- Prevention <strong>of</strong> Crack,ticsQuality Assurance <strong>of</strong> ScribeInspection on Chip Chip Electrical CharacteristicsElectrical CharacteristicsChip ScribeAppearance <strong>of</strong> ChipInspection on ChipAppearance PQC Lot JudgementFrameAssembling Assembling Appearance after Chip Quality Check <strong>of</strong> ChipBondingBondingAppearance after WireQuality Check <strong>of</strong> WireBondingBonding PQC Level Check Pull Strength, Compression Prevention <strong>of</strong> Open andWidth, Shear StrengthShortInspection afterAppearance after AssemblingAssembling PQC Lot JudgementSealing Sealing Appearance after Sealing Guarantee <strong>of</strong> AppearanceOutline, Dimensionand DimenSion PQC Level Check Marking Marking StrengthFinal Electrical Inspection Failure Analysis AnalySis <strong>of</strong> Failures, Failure Feedback <strong>of</strong> Analysis Infor-Mode, MechanismmationAppearance InspectionSampling Inspection onProductsReceivingShipmentFigure 3 Example <strong>of</strong> Inner Process Quality ControleHITACHI 29

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