Microcomputer Unit - Index of

--------------------------RELIABI LlTY TEST DATA3.2 ReilabiHty Test R •• ultsReliability Test Results of 8-bit single-chip microcomputer'devices are shown in Table 3 to Table 7.Table 3 Dynamic Life TestDevice Sample Size Component Hour FailureHD6801P 191 191000 0......................................................................... HD6805P 114 114000 0,.....................................................................................................HD6301P 92 92000 0HD63L05FP 40 40000 0HD6305XP 56 56000 0HD68POlHD68P0522222200022000oo(1) 85°C 85%RH Bias TestTable 4 High Temperature. High Humidity Test (Moisture Resistance Test)Device.vcc BiasHD6801P 5.5VHD6805P 5.5VHD6301P 5.5VTotal168 hrs 500 hrs0/22 0/220/22 0/220/176 0/1310/220 0/1751000 hrs0/220/220/1310/175(2) High Temperature High Humidity Storage Life TestDeviceHD6801PHD6805PHD6301PHD6301PHD63L05FPHD63L05FPHD6305XPCondition65°C 95%RH65°C 95%RH65°C 95%RH85°C 95%RH65°C 95%RH85°C 95%RH65°C 95%RH16B hrs500 hrs0/45 0/450/45 0/450/603 0/6030/234 1 */2340/160 0/1600/160 1*/1600/373 0/3731000 hrs0/450/450/6030/2330/1600/1590/373* Aluminium corrosion(3) Pressure Cooker Test(121°C.2atm)DeviceHD6801PHD6805PHD6301PHD6305XPHD63L05FP40hrs0/130/440/1350/830/8060 hrs 100 hrs0/13 0/130/44 0/440/135 0/1350/83 0/830/80 1*/80200 hrs0/130/440/1350/832**/79* Current leakage** Current leakage and aluminium corrosion_HITACHI 33