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<strong>MITSUBISHI</strong> OPTICAL SEMICONDUCTORSMEASURING PROCEDURESI Impedance1. Reference (SHORT)Measuring substrate (50 0 Micro strip line)Network analyzerFig. 2 Reference measuring system2. MeasurementFig. 3 Impedance characteristic measuring systemFig.2 and 3 are examples of circuits used tomeasure the input impedance characteristics. Atfirst the network analyser should be referenced byplacing at the output a SHORT (0 point on Smithchart). as shown on Fig. 2 .. Next. connect the circuit.measure the return-loss and phase at this time andplot these on a Smith chart. By repeating thisoperation at every frequency. the input impedancewill be calculated.Typical impedance characteristics of the ML4011 OR,with lead lengths of 2mm. are shown in Fig. 4 withthe bias currents as the parameter.Test frequency is swept from 100MHz to 1300MHzwith 100MHz steps.Above the threshold current. the impedance can beapproximated by a series connection of a resistanceof 3.50hm and an inductance of .2.3nH.Fig. 4 Example of impedance characteristic• . MrTSUBISHI.... ELECTRIC 1 - 21

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