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MITSUBISHI

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<strong>MITSUBISHI</strong> OPTICAL SEMICONDUCTORSMEASURING ,PROCEDURESI M.easurement of thermal resistanceIm (1mA),........, ,........,1,«lth)v, ~ hSAMPLEn I nVml v, Vm2Fig. 5 Timing chartThermal resistance is measured by measuring thetemperature· change in the junction surface by usingthe temperature dependence of the forward voltagedrop of the PN junction of LD.At first let a small current (1m = 1 mAl with anegligible temperature rise to flow in the forward .direction of the LD, and then measure the forwardvoltage drop (Vml) at that time.j"-ML40116R (¢ 5.6mm pkg)300200e 100ISc 80...ie'li 40

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