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Heavy metal adsorption on iron oxide and iron oxide-coated silica ...

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39generated at 45 kV <strong>and</strong> 40 mA, scanning from 10 ° to 120° 20. The (hkl) valuescorresp<strong>on</strong>ding to various peaks were calculated <strong>and</strong> compared with the st<strong>and</strong>ard powderdiffracti<strong>on</strong> file (PDF) (JCPDS, 1998).4.5.2 X-Ray Fluorescence (XRF)Elemental analysis was performed with a sequential X-ray spectrometer system(PW2400R, Philips Electr<strong>on</strong>ic Instruments Company). The PW2592/15 Rh tube <strong>and</strong>g<strong>on</strong>iometer detector were used <strong>and</strong> the X-ray path was in Helium. The results wereanalyzed with the Philips SemiQ program <strong>and</strong> were normalized to 100.0%.4.5.3 Particle Size Analysis (PSA)Particle size distributi<strong>on</strong> (PSD) was evaluated with a Beckman-Coulter LS 230 analyzeras a functi<strong>on</strong> of i<strong>on</strong>ic strength <strong>and</strong> pH. Laser diffracti<strong>on</strong> technique sizes particles byutilizing the diffracti<strong>on</strong> pattern of scattered light over a range of 0.04 pm to 2 mm.Sodium nitrate (NaNO3) was added to adjust the i<strong>on</strong>ic strength <strong>and</strong> pH was adjusted with10-1 N sodium hydr<strong>oxide</strong> (NaOH) or 10 -1 N nitric acid (HNO3). The system wascompletely mixed in a 1 L beaker with a stir bar for at least 3 hours at room temperaturebefore the particle size analysis. Reynolds number was calculated based <strong>on</strong> thecharacteristic length using the stir bar (Perry <strong>and</strong> Green, 1984).4.5.4 Scanning Electr<strong>on</strong> Microscopy (SEM)Envir<strong>on</strong>mental scanning electr<strong>on</strong> microscopy (ESEM, Model 2020, ElectroScanCorporati<strong>on</strong>) <strong>and</strong> LEO 1530 field emissi<strong>on</strong> (FE)-SEM were utilized to study the surface

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