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reSolution_LNT_No1_en - Leica Microsystems

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EDITORIAL<br />

CONTENT<br />

Title<br />

Panchromatic cathodoluminesc<strong>en</strong>ce image of<br />

cassiterite mineral (SnO 2 )<br />

Image Credits<br />

Scott Wight1 , Ed Vic<strong>en</strong>zi2 , Doug Meier1 , and<br />

Kurt B<strong>en</strong>kstein1 1 National Institute of Standards and<br />

Technology<br />

2 Smithsonian Institution<br />

Source: Smithsonial National Mineral<br />

Collection, Preparation: Cut and polished<br />

with the <strong>Leica</strong> EM TXP Data Collection:<br />

FEI Company QuantaTM 200F SEM with<br />

Gatan, MonoCL4 Elite System<br />

2 reSOLUTION<br />

Dear Readers,<br />

It gives me great pleasure to welcome you to the <strong>Leica</strong> NanoTechnology (<strong>LNT</strong>) edition of <strong>reSolution</strong> magazine. As<br />

it is our first totally exclusive <strong>LNT</strong> magazine, we decided to provide information on application techniques for both<br />

biology and materials sample preparation. All of the articles were prepared by our customers from around the<br />

world and I would like to express our thanks to everyone who provided the high quality articles for this edition.<br />

Sharing such experi<strong>en</strong>ces helps to disseminate techniques and applications around our EM community.<br />

To provide further support for issues regarding sample preparation techniques, later in the year we will launch<br />

a <strong>Leica</strong> EM Sample Preparation Sci<strong>en</strong>ce Laboratory online service where you will be able to find ev<strong>en</strong> more<br />

information about applications and products specific to your needs.<br />

Late last year we launched three new products to <strong>en</strong>hance sample preparation in your laboratory; a new ion<br />

beam slope cutter, the TIC 3X, for materials SEM preparation; a critical point dryer, CPD300 - a prerequisite for<br />

good SEM preparation for biological and some materials samples; and an <strong>en</strong>try level high pressure freezer for<br />

freezing samples in tubes, the SPF. You can find more information about these instrum<strong>en</strong>ts on our website at<br />

http://www.leica-microsystems.com/products/electron-microscope-sample-preparation/<br />

This year we have also launched some exciting new products. A new family of coaters, the ACE range, was<br />

pres<strong>en</strong>ted at the EMC meeting in Manchester UK. This new g<strong>en</strong>eration of coating systems continues in line<br />

with our developm<strong>en</strong>t philosophy, to automate tedious processes and push forward the boundaries of sample<br />

preparation in line with the needs of the sci<strong>en</strong>tific community.<br />

I hope you <strong>en</strong>joy this first <strong>LNT</strong> <strong>reSolution</strong> magazine and I look forward to your feedback.<br />

Happy Reading! ding!<br />

Best Wishes, es,<br />

Ian Lamswood wood<br />

Marketing Manager<br />

BIOLOGY<br />

Capturing neuro transmitter receptors 04<br />

and ion channels:<br />

High-resolution techniques to localize<br />

membrane proteins<br />

Biological Electron Microscopy at 07<br />

Durham University<br />

Dr. Martin W. Goldberg, Durham University, UK<br />

Substitutes for Uranyl Acetate in TEM 09<br />

Thin Section Post-Staining<br />

Perusing alternatives for staining applications<br />

for TEM thin sections<br />

Dry ultrathin sectioning combined with 13<br />

high pressure freezing/freeze-substitution<br />

improves ret<strong>en</strong>tion and visualization of<br />

calcium and phosphorus ions prior to nucleation<br />

of mineral crystals within osteoblastic<br />

cultures<br />

INDUSTRY<br />

A Word on Cathodoluminesc<strong>en</strong>ce 17<br />

Atomic Force Microscopy Study of a 19<br />

Stretched Impact Copolymer<br />

University of Wollongong Electron 21<br />

Microscopy C<strong>en</strong>tre<br />

REGISTRATION 23<br />

IMPRINT 23

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