reSolution_LNT_No1_en - Leica Microsystems
reSolution_LNT_No1_en - Leica Microsystems
reSolution_LNT_No1_en - Leica Microsystems
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EDITORIAL<br />
CONTENT<br />
Title<br />
Panchromatic cathodoluminesc<strong>en</strong>ce image of<br />
cassiterite mineral (SnO 2 )<br />
Image Credits<br />
Scott Wight1 , Ed Vic<strong>en</strong>zi2 , Doug Meier1 , and<br />
Kurt B<strong>en</strong>kstein1 1 National Institute of Standards and<br />
Technology<br />
2 Smithsonian Institution<br />
Source: Smithsonial National Mineral<br />
Collection, Preparation: Cut and polished<br />
with the <strong>Leica</strong> EM TXP Data Collection:<br />
FEI Company QuantaTM 200F SEM with<br />
Gatan, MonoCL4 Elite System<br />
2 reSOLUTION<br />
Dear Readers,<br />
It gives me great pleasure to welcome you to the <strong>Leica</strong> NanoTechnology (<strong>LNT</strong>) edition of <strong>reSolution</strong> magazine. As<br />
it is our first totally exclusive <strong>LNT</strong> magazine, we decided to provide information on application techniques for both<br />
biology and materials sample preparation. All of the articles were prepared by our customers from around the<br />
world and I would like to express our thanks to everyone who provided the high quality articles for this edition.<br />
Sharing such experi<strong>en</strong>ces helps to disseminate techniques and applications around our EM community.<br />
To provide further support for issues regarding sample preparation techniques, later in the year we will launch<br />
a <strong>Leica</strong> EM Sample Preparation Sci<strong>en</strong>ce Laboratory online service where you will be able to find ev<strong>en</strong> more<br />
information about applications and products specific to your needs.<br />
Late last year we launched three new products to <strong>en</strong>hance sample preparation in your laboratory; a new ion<br />
beam slope cutter, the TIC 3X, for materials SEM preparation; a critical point dryer, CPD300 - a prerequisite for<br />
good SEM preparation for biological and some materials samples; and an <strong>en</strong>try level high pressure freezer for<br />
freezing samples in tubes, the SPF. You can find more information about these instrum<strong>en</strong>ts on our website at<br />
http://www.leica-microsystems.com/products/electron-microscope-sample-preparation/<br />
This year we have also launched some exciting new products. A new family of coaters, the ACE range, was<br />
pres<strong>en</strong>ted at the EMC meeting in Manchester UK. This new g<strong>en</strong>eration of coating systems continues in line<br />
with our developm<strong>en</strong>t philosophy, to automate tedious processes and push forward the boundaries of sample<br />
preparation in line with the needs of the sci<strong>en</strong>tific community.<br />
I hope you <strong>en</strong>joy this first <strong>LNT</strong> <strong>reSolution</strong> magazine and I look forward to your feedback.<br />
Happy Reading! ding!<br />
Best Wishes, es,<br />
Ian Lamswood wood<br />
Marketing Manager<br />
BIOLOGY<br />
Capturing neuro transmitter receptors 04<br />
and ion channels:<br />
High-resolution techniques to localize<br />
membrane proteins<br />
Biological Electron Microscopy at 07<br />
Durham University<br />
Dr. Martin W. Goldberg, Durham University, UK<br />
Substitutes for Uranyl Acetate in TEM 09<br />
Thin Section Post-Staining<br />
Perusing alternatives for staining applications<br />
for TEM thin sections<br />
Dry ultrathin sectioning combined with 13<br />
high pressure freezing/freeze-substitution<br />
improves ret<strong>en</strong>tion and visualization of<br />
calcium and phosphorus ions prior to nucleation<br />
of mineral crystals within osteoblastic<br />
cultures<br />
INDUSTRY<br />
A Word on Cathodoluminesc<strong>en</strong>ce 17<br />
Atomic Force Microscopy Study of a 19<br />
Stretched Impact Copolymer<br />
University of Wollongong Electron 21<br />
Microscopy C<strong>en</strong>tre<br />
REGISTRATION 23<br />
IMPRINT 23