presentation slides - Texas A&M University
presentation slides - Texas A&M University
presentation slides - Texas A&M University
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I DDQ Too Important to Lose<br />
Important component of test suite<br />
Capable of detecting some unique defects<br />
When used with other test methods, it can reduce test<br />
escapes/defect level<br />
Detects some latent defects<br />
Useful for screening low reliability chips<br />
Useful as an alternative to burn-in (BI)<br />
BI less effective and expensive for DSM technologies<br />
Reduced voltage and temperature acceleration