presentation slides - Texas A&M University
presentation slides - Texas A&M University
presentation slides - Texas A&M University
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Why Multi-parameter Test?<br />
I DDQ test alone not enough<br />
Pass/fail decision difficult and prone to error<br />
Can result in yield loss/test escapes<br />
Need higher confidence in detecting flawed<br />
chips<br />
Defect detection capability diminishing for each<br />
test method in isolation<br />
Defect detection harder with each technology node