presentation slides - Texas A&M University
presentation slides - Texas A&M University
presentation slides - Texas A&M University
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Technology Impact on Testing<br />
Reduced transistor geometries<br />
Increased process variations<br />
New defect mechanisms<br />
Inaccurate fault models<br />
Higher levels of integration<br />
Reduced observability and controllability of defects<br />
Higher leakage currents<br />
Unable to distinguish faulty currents<br />
Reduced voltage, increased temperature<br />
Reduced effectiveness of reliability screens