presentation slides - Texas A&M University
presentation slides - Texas A&M University
presentation slides - Texas A&M University
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Summary<br />
Defect-based VLSI testing faces difficult<br />
challenges; I DDQ test loses its effectiveness<br />
Single parameter testing loses its effectiveness<br />
in screening faulty chips<br />
Correlating multiple test measurements<br />
necessary to screen true outliers<br />
Wafer-level test can be useful in reducing test<br />
time and overall test cost<br />
Has potential to reduce burn-in