presentation slides - Texas A&M University
presentation slides - Texas A&M University
presentation slides - Texas A&M University
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Wafer-level Analysis: Advantages<br />
Detection of defective chips at wafer probe<br />
Reduction in test costs and time<br />
Reduced packaging cost/die<br />
Provides insight into understanding underlying<br />
process variations<br />
Useful for detecting process glitches<br />
Different pass/fail criterion for different wafers<br />
Reduce yield penalty for fast and leaky wafers