presentation slides - Texas A&M University

Outlier Identification by Correlation
Correlation useful for estimating fault-free I DDQ
Can be used for outlier identification
Different methods
Vector-to-vector correlation [Unni et al.]
Die-to-die correlation
Die XY position on wafer [Daasch et al.]
Other parameters
F max [Keshavarzi et al.]
Flush delay [Sabade et al.]