presentation slides - Texas A&M University
presentation slides - Texas A&M University
presentation slides - Texas A&M University
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Is I DDQ Irreplaceable?<br />
Wafer Test<br />
At-speed<br />
IDDQ Functional IDDQ<br />
2467<br />
343<br />
73<br />
1545<br />
65<br />
3118<br />
35<br />
46<br />
42<br />
34<br />
121<br />
Stuck-at 23<br />
Scan<br />
+ 56 fail only IDDQ + AC scan<br />
+ 4 only functional + stuck-at<br />
98<br />
AC scan<br />
Stuck-at<br />
Scan<br />
521 48 19<br />
12<br />
6<br />
Package Test<br />
31<br />
46<br />
6<br />
25 25<br />
AC scan<br />
+ 36 fail only IDDQ + AC scan<br />
8<br />
7<br />
At-speed<br />
Functional<br />
150000 die at wafer, 76000 dice after package, package values normalized to wafer good parts<br />
Source: Peter Maxwell, Talk at Industrial Test Challenges, May 2002.<br />
4