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The Future of Instrumentation - High Frequency Electronics

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Product <strong>High</strong>lights<br />

Portable PIM Tester<br />

Anritsu Company expanded its line <strong>of</strong> industry-leading<br />

Passive Intermodulation (PIM) test solutions with the<br />

introduction <strong>of</strong> the PIM Master MW82119A, the industry’s<br />

first high-power, battery-operated, portable PIM test<br />

analyzer. One quarter the size and half the weight <strong>of</strong><br />

alternative PIM test solutions, the MW82119A <strong>of</strong>fers the<br />

inherent advantages <strong>of</strong> PIM Master – including 40W testing<br />

and Anritsu’s patented Distance-to-PIM (DTP) – in<br />

a compact housing suited for difficult-to-access sites, such<br />

as Remote Radio Head (RRH) installations and indoor<br />

Distributed Antenna Systems (DAS).<br />

Anritsu Company<br />

anritsu.com<br />

S<strong>of</strong>tware-Defined Tactical Radio<br />

<strong>The</strong> new R&S SDTR s<strong>of</strong>tware defined tactical radio<br />

enables high data rate, jam-resistant communications in<br />

network centric operations. <strong>The</strong> R&S SDTR is an open<br />

platform based on the s<strong>of</strong>tware communications architecture<br />

(SCA) standard. SCA based waveforms and other<br />

manufacturers’ waveforms can be ported to the radio,<br />

paving the way for interoperability with allied armed<br />

forces. <strong>The</strong> R&S SDTR is an investment for the future. It<br />

has the capability to handle future international standardized<br />

waveforms with data rates <strong>of</strong> up to several<br />

Mbit/s.<br />

Rohde & Schwarz<br />

rohde-schwarz.com<br />

Modeling S<strong>of</strong>tware<br />

Agilent Technologies Inc. announced the latest release<br />

<strong>of</strong> its device modeling s<strong>of</strong>tware platform, the Integrated<br />

Circuit Characterization and Analysis Program (IC-CAP).<br />

With IC-CAP 2013.01, Agilent introduces major improvements<br />

to its flagship product for high-frequency device<br />

modeling. One key improvement is turnkey extraction <strong>of</strong><br />

the Angelov-GaN model, the industry standard compact<br />

device model for GaN semiconductor devices.<br />

Agilent Technologies<br />

agilent.com<br />

61

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