The Future of Instrumentation - High Frequency Electronics
The Future of Instrumentation - High Frequency Electronics
The Future of Instrumentation - High Frequency Electronics
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Product <strong>High</strong>lights<br />
Portable PIM Tester<br />
Anritsu Company expanded its line <strong>of</strong> industry-leading<br />
Passive Intermodulation (PIM) test solutions with the<br />
introduction <strong>of</strong> the PIM Master MW82119A, the industry’s<br />
first high-power, battery-operated, portable PIM test<br />
analyzer. One quarter the size and half the weight <strong>of</strong><br />
alternative PIM test solutions, the MW82119A <strong>of</strong>fers the<br />
inherent advantages <strong>of</strong> PIM Master – including 40W testing<br />
and Anritsu’s patented Distance-to-PIM (DTP) – in<br />
a compact housing suited for difficult-to-access sites, such<br />
as Remote Radio Head (RRH) installations and indoor<br />
Distributed Antenna Systems (DAS).<br />
Anritsu Company<br />
anritsu.com<br />
S<strong>of</strong>tware-Defined Tactical Radio<br />
<strong>The</strong> new R&S SDTR s<strong>of</strong>tware defined tactical radio<br />
enables high data rate, jam-resistant communications in<br />
network centric operations. <strong>The</strong> R&S SDTR is an open<br />
platform based on the s<strong>of</strong>tware communications architecture<br />
(SCA) standard. SCA based waveforms and other<br />
manufacturers’ waveforms can be ported to the radio,<br />
paving the way for interoperability with allied armed<br />
forces. <strong>The</strong> R&S SDTR is an investment for the future. It<br />
has the capability to handle future international standardized<br />
waveforms with data rates <strong>of</strong> up to several<br />
Mbit/s.<br />
Rohde & Schwarz<br />
rohde-schwarz.com<br />
Modeling S<strong>of</strong>tware<br />
Agilent Technologies Inc. announced the latest release<br />
<strong>of</strong> its device modeling s<strong>of</strong>tware platform, the Integrated<br />
Circuit Characterization and Analysis Program (IC-CAP).<br />
With IC-CAP 2013.01, Agilent introduces major improvements<br />
to its flagship product for high-frequency device<br />
modeling. One key improvement is turnkey extraction <strong>of</strong><br />
the Angelov-GaN model, the industry standard compact<br />
device model for GaN semiconductor devices.<br />
Agilent Technologies<br />
agilent.com<br />
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