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Nano-Lithography - KTH

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Reduce resolution factor k 1<br />

Amplitude<br />

at Mask<br />

Normal Mask<br />

Phase Shift Mask<br />

R<br />

=<br />

d<br />

180° Phase Shift<br />

=<br />

k<br />

1<br />

λ<br />

NA<br />

λ<br />

2 −1<br />

( n )<br />

Amplitude<br />

at Wafer<br />

Intensity<br />

at Wafer<br />

• Different implementations on mask<br />

• Pattern dependent<br />

•k 1 can be reduced up to 40 %<br />

Per-Erik Hellstöm, Docent Lecture 14 th of February 2006<br />

14

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