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Nano-Lithography - KTH

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Reduce resolution factor k 1<br />

Resist chemistry<br />

436, 365 nm: Photo-Active-Component (PAC)<br />

248,193 nm: Photo-Acid-Generator (PAG)<br />

R<br />

=<br />

k<br />

1<br />

λ<br />

NA<br />

Mask design and<br />

resist process<br />

Contrast<br />

436, 365 nm: γ=2-3, (Q f /Q 0 ≈2.5)<br />

248,193 nm: γ=5-10 (Q f /Q 0 ≈1.3)<br />

λ [nm]<br />

436<br />

365<br />

248<br />

193<br />

k 1<br />

0.8<br />

0.6<br />

0.3-0.4<br />

0.3-0.4<br />

Per-Erik Hellstöm, Docent Lecture 14 th of February 2006<br />

15

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