Optical Coatings
Optical Coatings
Optical Coatings
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Fundamental Optics<br />
Material Properties <strong>Optical</strong> Specifications Gaussian Beam Optics<br />
<strong>Optical</strong> <strong>Coatings</strong><br />
ANGLE OF INCIDENCE<br />
The irradiance reflectance of any thin-film coating varies with<br />
the angle of incidence. Two main effects lead to a complicated<br />
dependence of reflectance (hence transmission) on the angle of<br />
incidence. First, the path difference of the front and rear surface<br />
reflection from any layer is a function of angle. As the angle of incidence<br />
increases from zero (normal incidence), the optical path difference<br />
is decreased. The change in path difference results in a<br />
change of phase difference between the two interfering reflections<br />
in an identical manner to the phase change resulting from tilting a<br />
Fabry-Perot interferometer.<br />
The reflectance of any optical interface varies according to the<br />
angle of incidence as shown in figure 5.10. Thin-film performance<br />
evaluation at arbitrary angles of incidence is therefore quite complex,<br />
even for a simple one-layer antireflection coating. In short, the<br />
phase difference between the two pertinent reflections changes<br />
together with their relative amplitude.<br />
COATING FORMULAS (SINGLE LAYER)<br />
Because of the practical importance and wide usage of singlelayer<br />
coatings, especially at oblique incidence, it is valuable to have<br />
formulas from which coating reflectance curves, as functions of<br />
wavelength, angle of incidence, and polarization, can be calculated.<br />
COATING DISPERSION FORMULA<br />
The first step in evaluating performance of a single-layer antireflection<br />
coating is to calculate the refractive index of the film and<br />
substrate at the wavelength of interest. For optical purposes, a thin<br />
film may be considered to be perfectly homogeneous. The refractive<br />
index of MgF 2 , whether amorphous or crystalline, is connected to<br />
density with the Lorentz-Lorenz formula. The crystalline ordinary<br />
and extraordinary indices of refraction may be averaged for the<br />
amorphous phase.<br />
The formulas for crystalline MgF 2 are, respectively,<br />
43<br />
(3.5821) (10 )<br />
n o = 1.36957 +<br />
( l40.14925)<br />
and<br />
43<br />
(3.7415) (10 )<br />
n e = 1.381 +<br />
( l40.14947)<br />
for the ordinary and extraordinary rays, where l is the wavelength<br />
in microns.<br />
For the average of the ordinary and extraordinary indices of<br />
refraction,<br />
n = n( l) = 1 2<br />
(n o + n e).<br />
(5.9)<br />
(5.10)<br />
(5.11)<br />
The value 1.38 is the universally accepted amorphous film index<br />
for MgF 2 at a wavelength of 550 nanometers, which assumes a<br />
packing density of 100%. Real films, however, tend to be slightly<br />
porous. The refractive index of a real magnesium fluoride film is usually<br />
slightly lower than 1.38 because the packing density is rarely<br />
100% in practice. Because it is a complex function of the manufacturing<br />
process, packing density varies slightly from batch to<br />
batch. Air and water vapor can also settle in the film and affect its<br />
refractive index. For Melles Griot magnesium fluoride coatings,<br />
this will usually correspond to an effective refractive index between<br />
97% and 100% of the 1.38 theoretical value.<br />
COATED SURFACE<br />
REFLECTANCE AT NORMAL INCIDENCE<br />
Suppose that the coating is of quarterwave optical thickness for<br />
some wavelength l. Let n a denote the refractive index of the external<br />
medium at this wavelength (1.0 for air or vacuum), and let n f and n s ,<br />
respectively, denote the film and substrate indices. For normal incidence<br />
at this wavelength (as shown in figure 5.11), the single-pass irradiance<br />
reflectance of the coated surface can be shown to be<br />
⎛<br />
R = n n n 2<br />
a s4<br />
⎞<br />
f<br />
⎜<br />
2 ⎟<br />
⎝ n n + n ⎠<br />
a s f<br />
air or vacuum<br />
index n a<br />
wavelength l<br />
MgF 2<br />
antireflection<br />
coating<br />
index n f<br />
Figure 5.11 Reflectance at normal incidence<br />
2<br />
substrate<br />
index n s<br />
(5.12)<br />
regardless of the polarization state of the incident radiation. This<br />
function is shown in figure 5.12<br />
COATED SURFACE<br />
REFLECTANCE AT OBLIQUE INCIDENCE<br />
At oblique incidence, the situation is more complex. Let n 1 , n 2 , and<br />
n 3 , respectively, represent the wavelength-dependent refractive indices<br />
of the external medium (air or vacuum), coating film, and substrate<br />
as shown in figure 5.13. Assume that the coating exhibits a reflectance<br />
extremum of the first order for some wavelength l d and angle of<br />
incidence v 1d in the external medium. The coating is completely<br />
specified when v 1d and l d are known. One may then identify n 2 with<br />
the film index n f (1.38 for MgF 2 at 550 nm). The extremum is a<br />
minimum if n 2 is less than n 3 and a maximum if n 2 exceeds n 3 . The<br />
same formulas apply in either case.<br />
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