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Fundamental Optics<br />

Material Properties <strong>Optical</strong> Specifications Gaussian Beam Optics<br />

<strong>Optical</strong> <strong>Coatings</strong><br />

ANGLE OF INCIDENCE<br />

The irradiance reflectance of any thin-film coating varies with<br />

the angle of incidence. Two main effects lead to a complicated<br />

dependence of reflectance (hence transmission) on the angle of<br />

incidence. First, the path difference of the front and rear surface<br />

reflection from any layer is a function of angle. As the angle of incidence<br />

increases from zero (normal incidence), the optical path difference<br />

is decreased. The change in path difference results in a<br />

change of phase difference between the two interfering reflections<br />

in an identical manner to the phase change resulting from tilting a<br />

Fabry-Perot interferometer.<br />

The reflectance of any optical interface varies according to the<br />

angle of incidence as shown in figure 5.10. Thin-film performance<br />

evaluation at arbitrary angles of incidence is therefore quite complex,<br />

even for a simple one-layer antireflection coating. In short, the<br />

phase difference between the two pertinent reflections changes<br />

together with their relative amplitude.<br />

COATING FORMULAS (SINGLE LAYER)<br />

Because of the practical importance and wide usage of singlelayer<br />

coatings, especially at oblique incidence, it is valuable to have<br />

formulas from which coating reflectance curves, as functions of<br />

wavelength, angle of incidence, and polarization, can be calculated.<br />

COATING DISPERSION FORMULA<br />

The first step in evaluating performance of a single-layer antireflection<br />

coating is to calculate the refractive index of the film and<br />

substrate at the wavelength of interest. For optical purposes, a thin<br />

film may be considered to be perfectly homogeneous. The refractive<br />

index of MgF 2 , whether amorphous or crystalline, is connected to<br />

density with the Lorentz-Lorenz formula. The crystalline ordinary<br />

and extraordinary indices of refraction may be averaged for the<br />

amorphous phase.<br />

The formulas for crystalline MgF 2 are, respectively,<br />

43<br />

(3.5821) (10 )<br />

n o = 1.36957 +<br />

( l40.14925)<br />

and<br />

43<br />

(3.7415) (10 )<br />

n e = 1.381 +<br />

( l40.14947)<br />

for the ordinary and extraordinary rays, where l is the wavelength<br />

in microns.<br />

For the average of the ordinary and extraordinary indices of<br />

refraction,<br />

n = n( l) = 1 2<br />

(n o + n e).<br />

(5.9)<br />

(5.10)<br />

(5.11)<br />

The value 1.38 is the universally accepted amorphous film index<br />

for MgF 2 at a wavelength of 550 nanometers, which assumes a<br />

packing density of 100%. Real films, however, tend to be slightly<br />

porous. The refractive index of a real magnesium fluoride film is usually<br />

slightly lower than 1.38 because the packing density is rarely<br />

100% in practice. Because it is a complex function of the manufacturing<br />

process, packing density varies slightly from batch to<br />

batch. Air and water vapor can also settle in the film and affect its<br />

refractive index. For Melles Griot magnesium fluoride coatings,<br />

this will usually correspond to an effective refractive index between<br />

97% and 100% of the 1.38 theoretical value.<br />

COATED SURFACE<br />

REFLECTANCE AT NORMAL INCIDENCE<br />

Suppose that the coating is of quarterwave optical thickness for<br />

some wavelength l. Let n a denote the refractive index of the external<br />

medium at this wavelength (1.0 for air or vacuum), and let n f and n s ,<br />

respectively, denote the film and substrate indices. For normal incidence<br />

at this wavelength (as shown in figure 5.11), the single-pass irradiance<br />

reflectance of the coated surface can be shown to be<br />

⎛<br />

R = n n n 2<br />

a s4<br />

⎞<br />

f<br />

⎜<br />

2 ⎟<br />

⎝ n n + n ⎠<br />

a s f<br />

air or vacuum<br />

index n a<br />

wavelength l<br />

MgF 2<br />

antireflection<br />

coating<br />

index n f<br />

Figure 5.11 Reflectance at normal incidence<br />

2<br />

substrate<br />

index n s<br />

(5.12)<br />

regardless of the polarization state of the incident radiation. This<br />

function is shown in figure 5.12<br />

COATED SURFACE<br />

REFLECTANCE AT OBLIQUE INCIDENCE<br />

At oblique incidence, the situation is more complex. Let n 1 , n 2 , and<br />

n 3 , respectively, represent the wavelength-dependent refractive indices<br />

of the external medium (air or vacuum), coating film, and substrate<br />

as shown in figure 5.13. Assume that the coating exhibits a reflectance<br />

extremum of the first order for some wavelength l d and angle of<br />

incidence v 1d in the external medium. The coating is completely<br />

specified when v 1d and l d are known. One may then identify n 2 with<br />

the film index n f (1.38 for MgF 2 at 550 nm). The extremum is a<br />

minimum if n 2 is less than n 3 and a maximum if n 2 exceeds n 3 . The<br />

same formulas apply in either case.<br />

5.10 1 Visit Us OnLine! www.mellesgriot.com

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