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<strong>Nonl<strong>in</strong>ear</strong> <strong>dynamics</strong> <strong>in</strong> semiconductor lasers 781<br />

Figure 10. Measured <strong>optical</strong> spectra of the VCSEL<br />

biased at 4.1 mA and subjected to <strong>external</strong> <strong>optical</strong><br />

<strong><strong>in</strong>jection</strong>. The ratio of <strong>in</strong>jected power is: (a) 1;(b)<br />

7; (c) 940. The free-runn<strong>in</strong>g spectrum is also shown<br />

for reference.<br />

Figure 11. Calculated <strong>optical</strong> spectra of the VCSEL<br />

biased at = 0.1 and subjected to <strong>external</strong> <strong>optical</strong><br />

<strong><strong>in</strong>jection</strong>. The ratio of <strong>in</strong>jected <strong>optical</strong> power is: (a) 1;<br />

(b)4;(c) 100.<br />

the Gaussian l<strong>in</strong>eshape is reta<strong>in</strong>ed but there is a shift of the feature. As the detun<strong>in</strong>g<br />

is decreased the feature narrows, with <strong>in</strong>creased amplitude. For <strong><strong>in</strong>jection</strong> close to the<br />

edge of the lock<strong>in</strong>g range, near −24 GHz, the emission feature becomes weak, <strong>in</strong>dicat<strong>in</strong>g<br />

stable, <strong><strong>in</strong>jection</strong>-locked operation. The smooth progression of the shift of the Fabry–Perot<br />

resonance feature is summarized <strong>in</strong> figure 13. For positive detun<strong>in</strong>gs, the shift decreases with<br />

<strong>in</strong>creas<strong>in</strong>g offset as the <strong><strong>in</strong>jection</strong> undergoes less amplification <strong>in</strong> the cavity. For negative<br />

detun<strong>in</strong>gs the shift is greater than, but approach<strong>in</strong>g, the magnitude of the <strong><strong>in</strong>jection</strong> offset as<br />

the offset decreases to more negative values. At the edge of the lock<strong>in</strong>g range this smooth<br />

progression abruptly halts and the laser displays a weaker, more complex spectrum. The<br />

shift of the cavity resonance frequency and the associated damp<strong>in</strong>g are caused <strong>by</strong> the reduced<br />

carrier density under strong <strong>external</strong> <strong><strong>in</strong>jection</strong>. The <strong>dynamics</strong> are strongly <strong>in</strong>fluenced <strong>by</strong> the<br />

magnitude of the shift and damp<strong>in</strong>g.

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