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Cost increase projections

from 1997 were effectively

curbed with cooperative

collaboration on Test

equipment arch (and DFT)

June 3-6, 3

2007 IEEE SW Test Workshop 10

Probe-tip Clean on Demand - Semiconductor Wafer Test Workshop

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Cost increase projections from 1997 were effectively curbed with cooperative collaboration on Test equipment arch (and DFT) June 3-6, 3 2007 IEEE SW Test Workshop 10

But, going forward …. June 3-6, 3 2007 IEEE SW Test Workshop 11

Page 1 and 2: Wafer level testing Challenges and
Page 3 and 4: Moore’s s Law: Our friend, our ch
Page 5 and 6: Test Cost Trends: Circa 1997 Each g
Page 7 and 8: 1. Developing New Tester Architectu
Page 9: Intel Test Cost Trends Today Intel
Page 13 and 14: Disturbing trends re-emerging emerg
Page 15 and 16: Tooling >50% Sort cost Deprec. Labo
Page 17 and 18: Proof of concept of performance Pas
Page 19 and 20: Known Good Die Sort Correlation to
Page 21 and 22: ….. And don’t t forget • Lead
Page 23 and 24: Supplier and customer collaboration
Page 25: Q & A June 3-6, 3 2007 IEEE SW Test

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