08.09.2014 Views

Sort Test Technology Development - Semiconductor Wafer Test ...

Sort Test Technology Development - Semiconductor Wafer Test ...

Sort Test Technology Development - Semiconductor Wafer Test ...

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

• Moore's Law<br />

Overview<br />

Last<br />

10yrs<br />

Future<br />

Challenges<br />

• <strong>Test</strong> cost prediction from 1990s<br />

• Equipment development impact: CMT<br />

• Current cost projections<br />

• Example of cost reduction through SIU<br />

• Other vectors of test cost<br />

• A word on collaboration<br />

• Summary<br />

June 3-6, 3<br />

2007 IEEE SW <strong>Test</strong> Workshop 2

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!