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Something needs to change …. Test Cost per Unit 90nm 65nm 45nm 32nm Test Cost per Unit Need actionable plan to cut cost by 10x in ~5yrs June 3-6, 3 2007 IEEE SW Test Workshop 14
Tooling >50% Sort cost Deprec. Labor Sort Tooling (SIU) SIU costs need to be 1/10 th current costs in ~5yrs June 3-6, 3 2007 IEEE SW Test Workshop 15
Page 1 and 2: Wafer level testing Challenges and
Page 3 and 4: Moore’s s Law: Our friend, our ch
Page 5 and 6: Test Cost Trends: Circa 1997 Each g
Page 7 and 8: 1. Developing New Tester Architectu
Page 9 and 10: Intel Test Cost Trends Today Intel
Page 11 and 12: But, going forward …. June 3-6, 3
Page 13: Disturbing trends re-emerging emerg
Page 17 and 18: Proof of concept of performance Pas
Page 19 and 20: Known Good Die Sort Correlation to
Page 21 and 22: ….. And don’t t forget • Lead
Page 23 and 24: Supplier and customer collaboration
Page 25: Q & A June 3-6, 3 2007 IEEE SW Test

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