Sort Test Technology Development - Semiconductor Wafer Test ...

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Needs for next 10-15yrs 15yrs •Cost • Lead time • Agility June 3-6, 3 2007 IEEE SW <strong>Test</strong> Workshop 22
Supplier and customer collaboration a must to win • Agree on what to design + fabricate – Comprehend use condition and manufacturing requirements •Make it • Make it work in required use condition • Improve June 3-6, 3 2007 IEEE SW <strong>Test</strong> Workshop 23
Page 1 and 2: Wafer level testing Challenges and
Page 3 and 4: Moore’s s Law: Our friend, our ch
Page 5 and 6: Test Cost Trends: Circa 1997 Each g
Page 7 and 8: 1. Developing New Tester Architectu
Page 9 and 10: Intel Test Cost Trends Today Intel
Page 11 and 12: But, going forward …. June 3-6, 3
Page 13 and 14: Disturbing trends re-emerging emerg
Page 15 and 16: Tooling >50% Sort cost Deprec. Labo
Page 17 and 18: Proof of concept of performance Pas
Page 19 and 20: Known Good Die Sort Correlation to
Page 21: ….. And don’t t forget • Lead
Page 25: Q & A June 3-6, 3 2007 IEEE SW Test

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