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1997 SIA Roadmap – Alarming!<br />
cents /transistor<br />
1<br />
0.1<br />
0.01<br />
0.001<br />
0.0001<br />
0.00001<br />
0.000001<br />
0.0000001<br />
1982<br />
1985<br />
1988<br />
Si manufacturing cost / transistor<br />
<strong>Test</strong> capital / transistor<br />
1991<br />
1994<br />
DFT ATE<br />
‘01 ITRS Roadmap Data<br />
1997<br />
2000<br />
‘97 SIA Roadmap Data<br />
2003<br />
2006<br />
2009<br />
2012<br />
• 1997: Predicted per xtor test cost to exceed fabrication cost<br />
• 2001: DFT & Structural <strong>Test</strong> reduce equipment cost &<br />
complexity<br />
– Lower requirements on I/O data rate, #IO, etc<br />
June 3-6, 3<br />
2007 IEEE SW <strong>Test</strong> Workshop 6
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