Sort Test Technology Development - Semiconductor Wafer Test ...

More documents

Recommendations

Info

Technologies with flatter cost structure desired, and they exist Old TechA Cost Metric Old TechB New - Large array New - Small array #Probes • Expectation: Lower and relatively flat cost. But, … • …. Not an order of magnitude reduction. Yet. June 3-6, 3 2007 IEEE SW <strong>Test</strong> Workshop 16
Proof of concept of performance Pass Performance metric Lifetime (#TD) • Further development required …. June 3-6, 3 2007 IEEE SW <strong>Test</strong> Workshop 17
Page 1 and 2: Wafer level testing Challenges and
Page 3 and 4: Moore’s s Law: Our friend, our ch
Page 5 and 6: Test Cost Trends: Circa 1997 Each g
Page 7 and 8: 1. Developing New Tester Architectu
Page 9 and 10: Intel Test Cost Trends Today Intel
Page 11 and 12: But, going forward …. June 3-6, 3
Page 13 and 14: Disturbing trends re-emerging emerg
Page 15: Tooling >50% Sort cost Deprec. Labo
Page 19 and 20: Known Good Die Sort Correlation to
Page 21 and 22: ….. And don’t t forget • Lead
Page 23 and 24: Supplier and customer collaboration
Page 25: Q & A June 3-6, 3 2007 IEEE SW Test

Sort Test Technology Development - Semiconductor Wafer Test ...

Create successful ePaper yourself

Delete template?

Save as template?