Overcoming the Challenges of Parallel RF Test - Semiconductor ...

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Roadblock #2 Are you measuring your die or your probe card? • RF Isolation – Port-to-Port – Die-to-Die RF Source Meter June 8 to 11, 2008 IEEE SW Test Workshop 10
Roadblock #3 Have you fully-optimized your test program? Time Insertion Loss Isolation Insertion Loss Position 1 Position 2 Isolation DUT 1 Insertion Loss Isolation Insertion Loss Position 1 Position 2 Isolation DUT 2 Insertion Loss Isolation Insertion Loss Position 1 Position 2 Isolation DUT 3 June 8 to 11, 2008 IEEE SW Test Workshop 11
Page 1 and 2: Roger Hayward Cascade Microtech Ove
Page 3 and 4: The Challenges Decrease the cost to
Page 5 and 6: • Known Good Die RF Test: The Cha
Page 7 and 8: Roadblocks • RF Calibration • R
Page 9: Roadblock #2 Are you measuring your
Page 13 and 14: Clearing the Obstacles • RF Calib
Page 15 and 16: • Measure 4 standards: - Short -
Page 17 and 18: Scalar RF Calibration Measure Short
Page 19 and 20: Clearing the Obstacles Cater your s
Page 25 and 26: Pyramid Accel Concept Enabling Para
Page 27 and 28: Pyramid Accel Fixture Enabling Para
Page 29: Summary Thank You! June 8 to 11, 20

Overcoming the Challenges of Parallel RF Test - Semiconductor ...

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