Overcoming the Challenges of Parallel RF Test - Semiconductor ...
Overcoming the Challenges of Parallel RF Test - Semiconductor ...
Overcoming the Challenges of Parallel RF Test - Semiconductor ...
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Debugging <strong>the</strong> <strong>Test</strong> Program<br />
• Reality Check:<br />
A significant challenge <strong>of</strong> <strong>Parallel</strong> <strong>RF</strong> <strong>Test</strong><br />
– Most devices are not as simple as this<br />
example…<br />
• <strong>Parallel</strong> <strong>Test</strong> Setup:<br />
– Develop test without burning up wafers.<br />
– Develop test with few wafers at a manual<br />
station.<br />
– Optimize test time.<br />
– Assure complete test coverage <strong>of</strong> part.<br />
June 8 to 11, 2008<br />
IEEE SW <strong>Test</strong> Workshop 24
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