Overcoming the Challenges of Parallel RF Test - Semiconductor ...

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Scalar RF Calibration Measure Short-Open to characterize RF path loss • Incorporate Shorting path into probe: June 8 to 11, 2008 IEEE SW Test Workshop 18
Clearing the Obstacles Cater your system for Parallel test Time Insertion Loss Isolation Insertion Loss Isolation Position 1 Position 2 Meter RF Source June 8 to 11, 2008 IEEE SW Test Workshop 19
Page 1 and 2: Roger Hayward Cascade Microtech Ove
Page 3 and 4: The Challenges Decrease the cost to
Page 5 and 6: • Known Good Die RF Test: The Cha
Page 7 and 8: Roadblocks • RF Calibration • R
Page 9 and 10: Roadblock #2 Are you measuring your
Page 11 and 12: Roadblock #3 Have you fully-optimiz
Page 13 and 14: Clearing the Obstacles • RF Calib
Page 15 and 16: • Measure 4 standards: - Short -
Page 17: Scalar RF Calibration Measure Short
Page 21 and 22: Clearing the Obstacles Cater your s
Page 23 and 24: Clearing the Obstacles Cater your s
Page 25 and 26: Pyramid Accel Concept Enabling Para
Page 27 and 28: Pyramid Accel Fixture Enabling Para
Page 29: Summary Thank You! June 8 to 11, 20

Overcoming the Challenges of Parallel RF Test - Semiconductor ...

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