Overcoming the Challenges of Parallel RF Test - Semiconductor ...

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Scalar RF Calibration Simple characterization techniques • Direct Measurement: – Use two ports. – Measure the loss, end-to-end. – Divide loss by 2. Probe Tips Length-Matched Thru • Implementation: – Length-matched thru. – Cal-thru. – On-die thru. June 8 to 11, 2008 IEEE SW Test Workshop 16
Scalar RF Calibration Measure Short-Open to characterize RF path loss • Directivity (E D ) and Source Match (E S ) are generally small. • Probe Short, Open. Take average. • Predicted loss is usually within 0.2dB @ 2 GHz Γ m a 0 b 1 ED 1 E R ES b 0 a 1 Measurement Probe Loss Actual Result Γ m = E D ERΓa + 1− E Γ S a Γ a Γ Γ m−Open m−Short Γ = 1 a Γ = E = D E ER + 1− E D − a =−1 1+ S ; ER E S E D ↓ 0; E ↓ S 0; Γ m = E Γ R a E R Γ = m−Open − Γ 2 m−Short June 8 to 11, 2008 IEEE SW Test Workshop 17
Page 1 and 2: Roger Hayward Cascade Microtech Ove
Page 3 and 4: The Challenges Decrease the cost to
Page 5 and 6: • Known Good Die RF Test: The Cha
Page 7 and 8: Roadblocks • RF Calibration • R
Page 9 and 10: Roadblock #2 Are you measuring your
Page 11 and 12: Roadblock #3 Have you fully-optimiz
Page 13 and 14: Clearing the Obstacles • RF Calib
Page 15: • Measure 4 standards: - Short -
Page 19 and 20: Clearing the Obstacles Cater your s
Page 25 and 26: Pyramid Accel Concept Enabling Para
Page 27 and 28: Pyramid Accel Fixture Enabling Para
Page 29: Summary Thank You! June 8 to 11, 20

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