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Area 1 (Session A): Advanced Packaging &<br />
System Integration<br />
A-021<br />
An Application of System in Package Technology: UTI<br />
ZHU Wenhui 1 , GUO Xiaowei, WEI Jianyou, WANG<br />
Yongzhong, LI Xizhou, QIN Fei, XIA Guofeng<br />
Tian shui Hua tian Microelectronics Co., Ltd, China<br />
A-023<br />
Thermal cycling reliability of edge and corner bonded<br />
package stackable very thin fine pitch ball grid array<br />
assemblies<br />
SHI Hongbin 1 and UEDA Toshitsugu.<br />
WASEDA University, Japan<br />
A-027<br />
Development Process of Phosphor Coating with Screen<br />
Printing for White Light Emitting Diode Packaging<br />
Shan Yu 1 , Liang Yang, Feng Jiao, Huai Zheng, Mingxiang<br />
Chen, Sheng Liu<br />
Wuhan National Laboratory for Optoelectronics, China<br />
A-031<br />
Process characterization and optimization of copper TSV i<br />
nterconnection<br />
Shenglin Ma, Yunhui Zhu, Xin Sun, Min Miao, Jin Chen,<br />
Yufeng Jin 1<br />
Peking University, China<br />
A-032<br />
Process development of multi-layer stacked chip module<br />
Shenglin Ma, Xin Sun, Yunhui Zhu, Wenping Kang,<br />
Qinghu Cui, Min Miao, Jin Chen, Yufeng Jin 1<br />
Peking University, China<br />
A-033<br />
Wafer Level Vacuum Packaging for MEMS Device by<br />
Solder Sealing<br />
Bing An 1 , Gan-ran Tang, Ya-nan Sun, Yi-ping Wu<br />
Huazhong University of Science & Technology, China<br />
A-034<br />
Wafer-level Chip-to-Wafer Integration of High-Sensitivity<br />
MEMS and IC<br />
Gaowei Xu 1 , Peili Yan, Xiao Chen, Wenguo Ning, Le Luo,<br />
Jiwei Jiao<br />
Shanghai Institute of Microsystem and Information<br />
Technology, Chinese Academy of Sciences, China<br />
A-036<br />
Preparation of Micro-nano Glass Cavities by a Novel Hot<br />
Forming Process<br />
Xinhu Luo, Jintang Shang 1 , Hui Yu, Jingdong Liu<br />
Southeast University, China<br />
A-043<br />
Solution to Leakage of Polyimide-structural Wafer Level<br />
Package<br />
Dong Chen 1 , CM Lai, KH Tan, Li Zhang, XinJiang Long<br />
Jiangyin Changdian Advanced Package Co., LTD, China<br />
POSTER SESSION 2<br />
Wednesday, August10, 14:50PM – 15:50PM<br />
36<br />
Area 2 (Session B): Packaging Materials &<br />
Processes<br />
B-037<br />
Improving the Thermal Conductivity of Epoxy Resins<br />
with Mesogenic Units for Electronic Packaging<br />
Jingfeng Hao 1 , Dayong Gui, Jianhong Liu, Wentao Zeng<br />
Shenzhen University, China<br />
B-040<br />
Deformation characteristics of micrometer coarse-grained<br />
aluminum wires exposed under ultrasonic at room<br />
temperature<br />
Hongjun JI, Mingyu LI 1<br />
Shenzhen Graduate School, Harbin Institute of<br />
Technology, China<br />
B-041<br />
Synthesis and Characterization of Benzocyclobutene-<br />
Functionalized Siloxane Thermoset with a Cyclic<br />
Structure<br />
Jun Yang 1 , Mingfei Sun, Yuanrong Cheng, Fei Xiao<br />
Fudan University, China<br />
B-042<br />
The study on the shaping of electroplated Copper Pillar<br />
Bumping<br />
Ying Han 1 , Hongqi Sun, Su Wang, Ming Li, Jiangyan Sun<br />
Shanghai Jiaotong University, China<br />
B-043<br />
Solder wetting on the substrates with Tin finish<br />
Cai Chen, Lei Zhang 1 and J. K. Shang<br />
Institute of Metal Research, Chinese Academy of<br />
Sciences, China<br />
B-045<br />
Elecromigration-induced failure of Ni/Sn3.0Ag0.5Cu/<br />
ENEPIG flip chip solder joint<br />
S.M. Zhou, M.L. Huang 1 , L.D. Chen, S. Ye, Y.M. Ye, J.F.<br />
Wang, X. Cao<br />
Dalian University of Technology, China<br />
B-046<br />
Effect of Solder Volume on Interfacial Reaction Between<br />
Sn-3Ag-0.5Cu Solder Ball and Cu Pad After Multiple<br />
Reflows<br />
Luwei Liu, Mingliang Huang 1<br />
Dalian University of Technology, China<br />
B-047<br />
Mechanical Properties and Electrochemical Corrosion<br />
Behavior of Al-Cu Solder Joints with solder alloys of<br />
Sn-Zn-Al, Sn-Zn-Ag, Sn-Zn-Ag-Al<br />
N. Kang, M. L. Huang 1<br />
Dalian University of Technology, China<br />
B-048<br />
Recent progress in the studies of low melting Sn-based<br />
Pb-free solder alloys<br />
Yang Lin 1 , Luqiao Yin, Xicheng Wei<br />
Shanghai University, China<br />
B-049<br />
Effects of soldering time and cooling rates on<br />
microstructures of intermetallic compounds in Sn-Ag/Cu