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Area 1 (Session A): Advanced Packaging &<br />

System Integration<br />

A-021<br />

An Application of System in Package Technology: UTI<br />

ZHU Wenhui 1 , GUO Xiaowei, WEI Jianyou, WANG<br />

Yongzhong, LI Xizhou, QIN Fei, XIA Guofeng<br />

Tian shui Hua tian Microelectronics Co., Ltd, China<br />

A-023<br />

Thermal cycling reliability of edge and corner bonded<br />

package stackable very thin fine pitch ball grid array<br />

assemblies<br />

SHI Hongbin 1 and UEDA Toshitsugu.<br />

WASEDA University, Japan<br />

A-027<br />

Development Process of Phosphor Coating with Screen<br />

Printing for White Light Emitting Diode Packaging<br />

Shan Yu 1 , Liang Yang, Feng Jiao, Huai Zheng, Mingxiang<br />

Chen, Sheng Liu<br />

Wuhan National Laboratory for Optoelectronics, China<br />

A-031<br />

Process characterization and optimization of copper TSV i<br />

nterconnection<br />

Shenglin Ma, Yunhui Zhu, Xin Sun, Min Miao, Jin Chen,<br />

Yufeng Jin 1<br />

Peking University, China<br />

A-032<br />

Process development of multi-layer stacked chip module<br />

Shenglin Ma, Xin Sun, Yunhui Zhu, Wenping Kang,<br />

Qinghu Cui, Min Miao, Jin Chen, Yufeng Jin 1<br />

Peking University, China<br />

A-033<br />

Wafer Level Vacuum Packaging for MEMS Device by<br />

Solder Sealing<br />

Bing An 1 , Gan-ran Tang, Ya-nan Sun, Yi-ping Wu<br />

Huazhong University of Science & Technology, China<br />

A-034<br />

Wafer-level Chip-to-Wafer Integration of High-Sensitivity<br />

MEMS and IC<br />

Gaowei Xu 1 , Peili Yan, Xiao Chen, Wenguo Ning, Le Luo,<br />

Jiwei Jiao<br />

Shanghai Institute of Microsystem and Information<br />

Technology, Chinese Academy of Sciences, China<br />

A-036<br />

Preparation of Micro-nano Glass Cavities by a Novel Hot<br />

Forming Process<br />

Xinhu Luo, Jintang Shang 1 , Hui Yu, Jingdong Liu<br />

Southeast University, China<br />

A-043<br />

Solution to Leakage of Polyimide-structural Wafer Level<br />

Package<br />

Dong Chen 1 , CM Lai, KH Tan, Li Zhang, XinJiang Long<br />

Jiangyin Changdian Advanced Package Co., LTD, China<br />

POSTER SESSION 2<br />

Wednesday, August10, 14:50PM – 15:50PM<br />

36<br />

Area 2 (Session B): Packaging Materials &<br />

Processes<br />

B-037<br />

Improving the Thermal Conductivity of Epoxy Resins<br />

with Mesogenic Units for Electronic Packaging<br />

Jingfeng Hao 1 , Dayong Gui, Jianhong Liu, Wentao Zeng<br />

Shenzhen University, China<br />

B-040<br />

Deformation characteristics of micrometer coarse-grained<br />

aluminum wires exposed under ultrasonic at room<br />

temperature<br />

Hongjun JI, Mingyu LI 1<br />

Shenzhen Graduate School, Harbin Institute of<br />

Technology, China<br />

B-041<br />

Synthesis and Characterization of Benzocyclobutene-<br />

Functionalized Siloxane Thermoset with a Cyclic<br />

Structure<br />

Jun Yang 1 , Mingfei Sun, Yuanrong Cheng, Fei Xiao<br />

Fudan University, China<br />

B-042<br />

The study on the shaping of electroplated Copper Pillar<br />

Bumping<br />

Ying Han 1 , Hongqi Sun, Su Wang, Ming Li, Jiangyan Sun<br />

Shanghai Jiaotong University, China<br />

B-043<br />

Solder wetting on the substrates with Tin finish<br />

Cai Chen, Lei Zhang 1 and J. K. Shang<br />

Institute of Metal Research, Chinese Academy of<br />

Sciences, China<br />

B-045<br />

Elecromigration-induced failure of Ni/Sn3.0Ag0.5Cu/<br />

ENEPIG flip chip solder joint<br />

S.M. Zhou, M.L. Huang 1 , L.D. Chen, S. Ye, Y.M. Ye, J.F.<br />

Wang, X. Cao<br />

Dalian University of Technology, China<br />

B-046<br />

Effect of Solder Volume on Interfacial Reaction Between<br />

Sn-3Ag-0.5Cu Solder Ball and Cu Pad After Multiple<br />

Reflows<br />

Luwei Liu, Mingliang Huang 1<br />

Dalian University of Technology, China<br />

B-047<br />

Mechanical Properties and Electrochemical Corrosion<br />

Behavior of Al-Cu Solder Joints with solder alloys of<br />

Sn-Zn-Al, Sn-Zn-Ag, Sn-Zn-Ag-Al<br />

N. Kang, M. L. Huang 1<br />

Dalian University of Technology, China<br />

B-048<br />

Recent progress in the studies of low melting Sn-based<br />

Pb-free solder alloys<br />

Yang Lin 1 , Luqiao Yin, Xicheng Wei<br />

Shanghai University, China<br />

B-049<br />

Effects of soldering time and cooling rates on<br />

microstructures of intermetallic compounds in Sn-Ag/Cu

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