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soldering reaction<br />
L. Y. Gu, L. Qu, H. T. Ma 1<br />
Dalian University of Technology, China<br />
B-050<br />
Effect of Electromigration on Creep Rupture Life of<br />
Sn-Ag-Cu Solder Joints<br />
H. Y. Liu, Q. S. Zhu 1 , Z. G. Wang, J. K. Shang<br />
Institute of Metal Research, Chinese Academy of<br />
Sciences, China<br />
B-051<br />
Thermal and Dielectric Properties of Bismaleimide-<br />
Triazine resin/Boron Nitride Composite<br />
Xiaoliang Zeng, Shuhui Yu 1 , Rong Sun, Ruxu Du<br />
Shenzhen Institutes of Advanced Technology, Chinese<br />
Academy of Sciences, China<br />
B-052<br />
Carboxyl-Terminated Polyesterimide/Epoxy Resin<br />
System: Preparation and Thermomechanical Properties<br />
Dayong Gui 1 , XinMiao, Jingfeng Hao, Wentao Zeng,<br />
Jianhong Liu<br />
Shenzhen University, China<br />
B-053<br />
Analysis of Cu6Sn5 grain orientations in Sn3.0Ag0.5Cu<br />
lead-free solder joints<br />
Lina Niu, Yanhong Tian 1 , Chunqing Wang<br />
Harbin Institute of Technology, China<br />
B-054<br />
Dielectric properties of BaTiO3 -based mu ltilayered thin<br />
films for capacitors prepared by sol-gel technique<br />
Bin Li 1 , Chunqing Wang, Wei Zhang, Ying Zhong, Weiwei<br />
Wu<br />
Harbin Institute of Technology, China<br />
Area 3 (Session C): Packaging Design &<br />
Modeling<br />
C-027<br />
Morphology and nano-indentation properties of<br />
intermetallic compounds in solder joints<br />
ZHONG Weixu, QIN Fei 1 , AN Tong<br />
Beijing University of Technology, China<br />
C-028<br />
3D Modeling and Simulation of Heat Transfer for<br />
Internal Channel Cooling of 3D-Chip Stacks<br />
Jing Zhang 1 ,Guidotti.Daniel, Xueping Guo, Jing Zhou,<br />
Liqiang Cao, Daquan Yu, Lixiwan<br />
Institute of Microelectronics, Chinese Academy of<br />
Sciences, China<br />
C-029<br />
Modeling and Finite-Element Full-wave Simulation of<br />
Glass Interposer with TGVs (Through-Glass-Vias) for 3D<br />
packaging<br />
Zhang jing 1 , Sun xiaofeng, Yu daquan, Cao liqiang, Wan<br />
lixi<br />
Institute of Microelectronics, Chinese Academy of<br />
Sciences, China<br />
C-030<br />
Ultra-Wideband Noise Isolation on Power Distribution<br />
Network of High-speed Package Substrate<br />
Baoxia Li 1 and Lixi Wan<br />
Institute of Microelectronics, Chinese Academy of<br />
37<br />
Sciences, China<br />
C-031<br />
A novel cooling structure for electronic package<br />
Jun Li 1 , Xueping Guo, Jing Zhang, Liqiang Cao, Lixi Wan<br />
Institute of Microelectronics, Chinese Academy of<br />
Sciences, China<br />
C-033<br />
Power Integrity Simulation for Multilayer Power<br />
Distribution Networks Based on GTLE and Via Model<br />
Yunyan Zhou 1 , Lixi Wan, Shuhua Liu, Liqiang Cao, Jia jia<br />
Institute of Microelectronics, Chinese Academy of<br />
Sciences, China<br />
C-037<br />
Geometric optimization of Carbon nanotubes(CNTs)<br />
microchannel with liquid flow<br />
Wang Dianxiao 1 , Wang Xiaojing, Wang Jia, Li Zongshuo<br />
Shanghai University, China<br />
C-038<br />
Current optimization of different chips for High Power<br />
Light-emitting diodes<br />
Liang Yang, Sheng Liu 1 , Run Chen, Zhicheng Lv<br />
Huazhong University of Science & Technology, China<br />
C-040<br />
Effects of Package Type, Die Size, Material and<br />
Interconnection on the Junction-to-Case Thermal<br />
Resistance of Power MOSFET Packages<br />
Cong Yue 1 , Jun Lu, Xiaotian Zhang, Yueh-Se Ho<br />
Agape Package Manufacturing Ltd., China<br />
C-041<br />
Modeling and Design of Coplanar Structure in QFP80<br />
Package for RFIC Applications<br />
Sun haiyan 1 , Wu jianhui<br />
Southeast University, China<br />
C-044<br />
Thermal Stress Simulation of PBGA under Natural<br />
Convection Using A Fluid-solid Coupling Method<br />
Zhimin Wan, Ling Xu, Xiaobing Luo 1 , Sheng Liu<br />
Huazhong University of Science & Technology, China<br />
C-046<br />
Low Electromagnetic Interference Optoelectronic<br />
Packaging of a 40Gbps Optical Transceiver<br />
WAN Lixi 1 , LI Zhihua, LI Baoxia, LIU Fengman, LI Jun,<br />
SONG Jian, XIANG Haifei & ZHONG Hanmei<br />
Institute of Microelectronics, Chinese Academy of<br />
Sciences, China<br />
Area 4 (Session E): Advanced Manufacturing<br />
Technologies & Packaging Equipment<br />
E-002<br />
Development of a three-dimensional integrated solder<br />
ball bumping & bonding method for MEMS devices<br />
Lei Yang 1 , Wei Liu, Chunqing Wang, Yanhong Tian<br />
Harbin Institute of Technology, China<br />
E-004<br />
Technology of Embedded Capacitance And Resistance<br />
Hu Shaohua 1<br />
Shennan Circuit Co., China<br />
E-005<br />
An Experimental Investigation on Thermal Contact<br />
Resistance Across Metal Contact Interfaces<br />
Xiaobing Luo 1 , Han Feng, Jv Liu, Minglu Liu and Sheng