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soldering reaction<br />

L. Y. Gu, L. Qu, H. T. Ma 1<br />

Dalian University of Technology, China<br />

B-050<br />

Effect of Electromigration on Creep Rupture Life of<br />

Sn-Ag-Cu Solder Joints<br />

H. Y. Liu, Q. S. Zhu 1 , Z. G. Wang, J. K. Shang<br />

Institute of Metal Research, Chinese Academy of<br />

Sciences, China<br />

B-051<br />

Thermal and Dielectric Properties of Bismaleimide-<br />

Triazine resin/Boron Nitride Composite<br />

Xiaoliang Zeng, Shuhui Yu 1 , Rong Sun, Ruxu Du<br />

Shenzhen Institutes of Advanced Technology, Chinese<br />

Academy of Sciences, China<br />

B-052<br />

Carboxyl-Terminated Polyesterimide/Epoxy Resin<br />

System: Preparation and Thermomechanical Properties<br />

Dayong Gui 1 , XinMiao, Jingfeng Hao, Wentao Zeng,<br />

Jianhong Liu<br />

Shenzhen University, China<br />

B-053<br />

Analysis of Cu6Sn5 grain orientations in Sn3.0Ag0.5Cu<br />

lead-free solder joints<br />

Lina Niu, Yanhong Tian 1 , Chunqing Wang<br />

Harbin Institute of Technology, China<br />

B-054<br />

Dielectric properties of BaTiO3 -based mu ltilayered thin<br />

films for capacitors prepared by sol-gel technique<br />

Bin Li 1 , Chunqing Wang, Wei Zhang, Ying Zhong, Weiwei<br />

Wu<br />

Harbin Institute of Technology, China<br />

Area 3 (Session C): Packaging Design &<br />

Modeling<br />

C-027<br />

Morphology and nano-indentation properties of<br />

intermetallic compounds in solder joints<br />

ZHONG Weixu, QIN Fei 1 , AN Tong<br />

Beijing University of Technology, China<br />

C-028<br />

3D Modeling and Simulation of Heat Transfer for<br />

Internal Channel Cooling of 3D-Chip Stacks<br />

Jing Zhang 1 ,Guidotti.Daniel, Xueping Guo, Jing Zhou,<br />

Liqiang Cao, Daquan Yu, Lixiwan<br />

Institute of Microelectronics, Chinese Academy of<br />

Sciences, China<br />

C-029<br />

Modeling and Finite-Element Full-wave Simulation of<br />

Glass Interposer with TGVs (Through-Glass-Vias) for 3D<br />

packaging<br />

Zhang jing 1 , Sun xiaofeng, Yu daquan, Cao liqiang, Wan<br />

lixi<br />

Institute of Microelectronics, Chinese Academy of<br />

Sciences, China<br />

C-030<br />

Ultra-Wideband Noise Isolation on Power Distribution<br />

Network of High-speed Package Substrate<br />

Baoxia Li 1 and Lixi Wan<br />

Institute of Microelectronics, Chinese Academy of<br />

37<br />

Sciences, China<br />

C-031<br />

A novel cooling structure for electronic package<br />

Jun Li 1 , Xueping Guo, Jing Zhang, Liqiang Cao, Lixi Wan<br />

Institute of Microelectronics, Chinese Academy of<br />

Sciences, China<br />

C-033<br />

Power Integrity Simulation for Multilayer Power<br />

Distribution Networks Based on GTLE and Via Model<br />

Yunyan Zhou 1 , Lixi Wan, Shuhua Liu, Liqiang Cao, Jia jia<br />

Institute of Microelectronics, Chinese Academy of<br />

Sciences, China<br />

C-037<br />

Geometric optimization of Carbon nanotubes(CNTs)<br />

microchannel with liquid flow<br />

Wang Dianxiao 1 , Wang Xiaojing, Wang Jia, Li Zongshuo<br />

Shanghai University, China<br />

C-038<br />

Current optimization of different chips for High Power<br />

Light-emitting diodes<br />

Liang Yang, Sheng Liu 1 , Run Chen, Zhicheng Lv<br />

Huazhong University of Science & Technology, China<br />

C-040<br />

Effects of Package Type, Die Size, Material and<br />

Interconnection on the Junction-to-Case Thermal<br />

Resistance of Power MOSFET Packages<br />

Cong Yue 1 , Jun Lu, Xiaotian Zhang, Yueh-Se Ho<br />

Agape Package Manufacturing Ltd., China<br />

C-041<br />

Modeling and Design of Coplanar Structure in QFP80<br />

Package for RFIC Applications<br />

Sun haiyan 1 , Wu jianhui<br />

Southeast University, China<br />

C-044<br />

Thermal Stress Simulation of PBGA under Natural<br />

Convection Using A Fluid-solid Coupling Method<br />

Zhimin Wan, Ling Xu, Xiaobing Luo 1 , Sheng Liu<br />

Huazhong University of Science & Technology, China<br />

C-046<br />

Low Electromagnetic Interference Optoelectronic<br />

Packaging of a 40Gbps Optical Transceiver<br />

WAN Lixi 1 , LI Zhihua, LI Baoxia, LIU Fengman, LI Jun,<br />

SONG Jian, XIANG Haifei & ZHONG Hanmei<br />

Institute of Microelectronics, Chinese Academy of<br />

Sciences, China<br />

Area 4 (Session E): Advanced Manufacturing<br />

Technologies & Packaging Equipment<br />

E-002<br />

Development of a three-dimensional integrated solder<br />

ball bumping & bonding method for MEMS devices<br />

Lei Yang 1 , Wei Liu, Chunqing Wang, Yanhong Tian<br />

Harbin Institute of Technology, China<br />

E-004<br />

Technology of Embedded Capacitance And Resistance<br />

Hu Shaohua 1<br />

Shennan Circuit Co., China<br />

E-005<br />

An Experimental Investigation on Thermal Contact<br />

Resistance Across Metal Contact Interfaces<br />

Xiaobing Luo 1 , Han Feng, Jv Liu, Minglu Liu and Sheng

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