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Etude et impact du bruit de fond corrélé pour la mesure de l'angle ...

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110 5. Corre<strong>la</strong>ted background<br />

can be estimated comparing tagged and un-tagged sample in the high energy<br />

tail of the prompt spectrum, assuming they would remain unchanged at low<br />

energy < 12 MeV. The estimation of the tagging e ciencies represent the<br />

main limitation of these techniques. However, IV and OV are in<strong>de</strong>pen<strong>de</strong>nt<br />

d<strong>et</strong>ectors based on di↵erent technologies. They would provi<strong>de</strong> in<strong>de</strong>pen<strong>de</strong>nt<br />

estimation of corre<strong>la</strong>ted background which, if in agreement, would validate<br />

the assumption ma<strong>de</strong> on the tagging e ciency.<br />

IV tagging<br />

tel-00821629, version 1 - 11 May 2013<br />

Since FN are generated with high multiplicity, some of them are expected to<br />

<strong>de</strong>posit energy in both the ID and IV. The DAQ system is <strong>de</strong>signed in such<br />

a way that both ID and IV d<strong>et</strong>ectors are read-out whatever d<strong>et</strong>ector causes<br />

the trigger. In case of ID trigger, the IV d<strong>et</strong>ection threshold is then lowered<br />

to ⇠ 1 MeV, making the IV sensitive to FNs via proton recoil or captures<br />

on H. Defining a tagging condition in the IV would then allow to select a<br />

sample of FN which would provi<strong>de</strong> the spectral shape in [0.7, 12.2] MeV<br />

energy region.<br />

Given the small angu<strong>la</strong>r acceptance by which the SM enter the ID through<br />

the chimney, IV is expected to tag SM with smaller e ciency. A di↵erent<br />

technique to infer the SM spectral shape is to take advantage of the Michel<br />

electron spectra, which extend up to ⇠ 60 MeV, and it is uncorre<strong>la</strong>ted from<br />

the energy <strong>de</strong>posited by its parent muon. A pure sample of SM could then be<br />

obtained selecting the <strong>de</strong><strong>la</strong>yed Michel electron at high energy, > 20 MeV. In<br />

this energy region, ¯⌫ e and FN contaminations are expected to be negligible,<br />

since their <strong>de</strong><strong>la</strong>yed events <strong>de</strong>posit energy by Gd capture b<strong>et</strong>ween 6 MeV and<br />

12 MeV.<br />

OV tagging<br />

The OV is a suitable d<strong>et</strong>ector to i<strong>de</strong>ntify corre<strong>la</strong>ted background by tagging<br />

the parent muon. The tagging is performed by time coinci<strong>de</strong>nces b<strong>et</strong>ween<br />

an OV hit and the prompt-like energy <strong>de</strong>position in the ID.<br />

The SM component is expected to be tagged with high e ciency since the<br />

muon enter in the d<strong>et</strong>ector through the chimney which is surroun<strong>de</strong>d by OV<br />

scintil<strong>la</strong>tor strips. A smaller tagging e ciency is expected for FN since the<br />

parent muon could interact far from the d<strong>et</strong>ector and miss the OV.<br />

Pulse shape discrimination<br />

A pulse shape discrimination (PSD) technique is also been investigated to<br />

perform event tagging. PSD is expected to tag FNs via the di↵erent scintil<strong>la</strong>tion<br />

shape pro<strong>du</strong>ced by the recoil protons, with respect to electrons and<br />

positrons. The distribution of the time of each pulse in each event is compared<br />

to a reference distribution, obtained with 137 Cs calibration source,

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