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Etude et impact du bruit de fond corrélé pour la mesure de l'angle ...

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134 5. Corre<strong>la</strong>ted background<br />

evt.<br />

IVT 110<br />

3<br />

¯⌫ e +IV /n 19<br />

IVT bkg. subtracted 89<br />

Table 5.7: Summary of the number of IVT events, background events and<br />

the total number of events upon background subtraction.<br />

5.4.4 Fast Neutron shape and rate<br />

tel-00821629, version 1 - 11 May 2013<br />

The FN spectral shape S FN (E) is obtained by fitting the background subtracted<br />

IVT spectrum shown in Fig. 5.18. Since the IVT spectrum appear<br />

to be rather f<strong>la</strong>t, a linear mo<strong>de</strong>l is fitted. The total untagged FN rate (R FN )<br />

is obtained by Eq. 5.6:<br />

R FN =<br />

⇢ t<br />

⇥ 1 Z 12.2 MeV<br />

⇥<br />

✏ t ⇥ ✏ IV T t live 0.7 MeV S FN(E)dE (5.6)<br />

where the IVT rate is corrected for the FN/SM separation e ciency (✏ t ) and<br />

purity (⇢ t ) and scaled for the IVT e ciency (✏ IV T ), summarised in Tab. 5.8.<br />

✏ IV T ✏ t ⇢ t t live [d]<br />

0.33 ± 0.05 0.78 ± 0.01 0.97 ± 0.08 240.17<br />

Table 5.8: Scaling factors to obtain the untagged amount of FN events and<br />

total d<strong>et</strong>ector live time for rate computation.<br />

Tab. 5.9 summarise the total statistical uncertainty, the uncertainty coming<br />

from the backgrounds subtraction and the systematic uncertainties in<strong>du</strong>ced<br />

by the scaling factors. The most important contribution to the total uncertainty<br />

comes from the backgrounds subtraction, which is limited by the<br />

low statistic of the background sample as summarised in Tab. 5.7. While<br />

the uncertainty on the ¯⌫ e +IV /n background is expected to improve only<br />

with a bigger data sample, the uncertainty on the background is expected<br />

to improve by selecting the background with multiple o↵-time window, in<br />

or<strong>de</strong>r to increase the statics of the sample. Systematic uncertainties are<br />

propagated to the IVT spectrum bin by bin.<br />

The linear fit to the IVT spectrum and its 1 uncertainty are shown in<br />

Fig. 5.19 . Both a f<strong>la</strong>t and a sloped linear mo<strong>de</strong>l are tested and the results are

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